Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks

Zoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events....

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Autores principales: Galván Josa, V., Fracchia, D., Castellano, G., Crespo, E., Kang, Kyung Won, Bonetto, Rita Dominga
Formato: Articulo
Lenguaje:Inglés
Publicado: 2013
Materias:
Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/80682
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-80682
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning
spellingShingle Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning
Galván Josa, V.
Fracchia, D.
Castellano, G.
Crespo, E.
Kang, Kyung Won
Bonetto, Rita Dominga
Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
topic_facet Ingeniería
Backscattered electron imaging
X-ray maps
plagioclase zoning
description Zoning patterns in plagioclases are related to abrupt changes in the anorthite content along the crystal growing direction. Accurate characterization of these patterns by electron microprobe is useful to identify magma chamber processes such as recharge, mingling and whole-chamber overturn events. In this work, a new procedure to obtain high resolution quantitative maps of anorthite concentration in single plagioclase crystals is developed. The methodology consists in performing a calibration of backscattered electron images using quantitative X-ray maps. The ultimate resolution of charac- teristic X-rays and backscattered electron signals is studied by Monte Carlo simulation. The method is applied to characterize the chemical composition of a volcanic plagioclase from the Cerro Vilama, Argentina. The results obtained are more precise than the values given by the methods commonly used in the study of plagioclase composition, i.e. the classical profiling by electron microprobe point analysis or the modern backscattered electron image calibration by means of quantitative energy or wavelength dispersive X-ray analysis at a few selected points.
format Articulo
Articulo
author Galván Josa, V.
Fracchia, D.
Castellano, G.
Crespo, E.
Kang, Kyung Won
Bonetto, Rita Dominga
author_facet Galván Josa, V.
Fracchia, D.
Castellano, G.
Crespo, E.
Kang, Kyung Won
Bonetto, Rita Dominga
author_sort Galván Josa, V.
title Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_short Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_full Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_fullStr Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_full_unstemmed Backscattered electron images, X-ray maps and Monte Carlo simulations applied to the study of plagioclase composition in volcanic rocks
title_sort backscattered electron images, x-ray maps and monte carlo simulations applied to the study of plagioclase composition in volcanic rocks
publishDate 2013
url http://sedici.unlp.edu.ar/handle/10915/80682
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