Analog Configurability-Test Scheme for an Embedded Op-Amp Module in TI MSP430 Microcontrollers

This paper proposes the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit, composed by operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family, with the aim of verifying its mode progra...

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Autores principales: Laprovitta, Agustín, Peretti, Gabriela, Romero, Eduardo
Formato: Objeto de conferencia
Lenguaje:Inglés
Publicado: 2013
Materias:
Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
microcontroller test
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/76856
http://42jaiio.sadio.org.ar/proceedings/simposios/Trabajos/AST/12.pdf
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-76856
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
microcontroller test
spellingShingle Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
microcontroller test
Laprovitta, Agustín
Peretti, Gabriela
Romero, Eduardo
Analog Configurability-Test Scheme for an Embedded Op-Amp Module in TI MSP430 Microcontrollers
topic_facet Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
microcontroller test
description This paper proposes the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit, composed by operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family, with the aim of verifying its mode programmability. This test strategy is particularly useful for applications involving in-field circuit reconfiguration, and require reliability and safe operation characteristics. The approach minimizes the cost in hardware overhead by employing only the hardware and software resources of the microcontroller. An embedded test routine sequentially programs selected module configurations, sets the test stimulus, acquires data from the internal ADC, and performs required calculations to determine the gain of the block. The test approach is experimentally evaluated using an embedded-system based real application board. Our experimental results show very good repeatability, with very low errors. These results show that the ACT proposed here is useful for testing the functionality of the EACC under test in a real application context by using a simple strategy at a very low cost.
format Objeto de conferencia
Objeto de conferencia
author Laprovitta, Agustín
Peretti, Gabriela
Romero, Eduardo
author_facet Laprovitta, Agustín
Peretti, Gabriela
Romero, Eduardo
author_sort Laprovitta, Agustín
title Analog Configurability-Test Scheme for an Embedded Op-Amp Module in TI MSP430 Microcontrollers
title_short Analog Configurability-Test Scheme for an Embedded Op-Amp Module in TI MSP430 Microcontrollers
title_full Analog Configurability-Test Scheme for an Embedded Op-Amp Module in TI MSP430 Microcontrollers
title_fullStr Analog Configurability-Test Scheme for an Embedded Op-Amp Module in TI MSP430 Microcontrollers
title_full_unstemmed Analog Configurability-Test Scheme for an Embedded Op-Amp Module in TI MSP430 Microcontrollers
title_sort analog configurability-test scheme for an embedded op-amp module in ti msp430 microcontrollers
publishDate 2013
url http://sedici.unlp.edu.ar/handle/10915/76856
http://42jaiio.sadio.org.ar/proceedings/simposios/Trabajos/AST/12.pdf
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AT perettigabriela analogconfigurabilitytestschemeforanembeddedopampmoduleintimsp430microcontrollers
AT romeroeduardo analogconfigurabilitytestschemeforanembeddedopampmoduleintimsp430microcontrollers
bdutipo_str Repositorios
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