Opto-electronic characterization of TiO₂/Metal/TiO₂ multilayers

Transparent conductive oxides (TCOs) play an important role in many optoelectronic devices such as solar cells, organic light emitting diodes, touch panel and efficiency energy applications, heat mirrors and thermoelectric materials. In recent years, many researchers proposed a TCO/metal/TCO multila...

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Detalles Bibliográficos
Autores principales: Valluzzi, Marcos G., Valluzzi, Lucas G., Meyer, Marcos, Damonte, Laura Cristina
Formato: Objeto de conferencia
Lenguaje:Inglés
Publicado: 2017
Materias:
Física
Multilayers
Transparent conductive oxides
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/155346
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-155346
record_format dspace
spelling I19-R120-10915-1553462023-07-11T04:06:53Z http://sedici.unlp.edu.ar/handle/10915/155346 Opto-electronic characterization of TiO₂/Metal/TiO₂ multilayers Valluzzi, Marcos G. Valluzzi, Lucas G. Meyer, Marcos Damonte, Laura Cristina 2017-06 2017 2023-07-10T17:07:03Z en Física Multilayers Transparent conductive oxides Transparent conductive oxides (TCOs) play an important role in many optoelectronic devices such as solar cells, organic light emitting diodes, touch panel and efficiency energy applications, heat mirrors and thermoelectric materials. In recent years, many researchers proposed a TCO/metal/TCO multilayer structure with advanced electrical properties, mechanical flexibility, chemical stability and high optical transparency than a TCO single layer. Multilayer films of TiO₂/Cu/TiO₂ and TiO2/Co/TiO2were grown on glass substrate by DC magnetron sputtering technique at low temperature deposition for low cost applications. Copper interlayer was chosen as a possible replacement of Ag due to their comparable electrical conductivity and relativity low cost. Cobalt interlayer is studied for ferromagnetic properties at room temperature because of its potential applications in spintronics. The deposition time was chosen to obtain estimated thickness for layers of 30 nm while metal interlayers of 12, 15 and 18 nm thick were grown. The optical, electrical, structural and morphological properties of these films were characterized by UV-visible spectroscopy, four probe technique, X-rays diffraction patterns and atomic force microscopy (AFM) respectively. Figures of merit (FOM) are determinate for transparent solar cells electrode and others applications. Instituto de Física La Plata Objeto de conferencia Objeto de conferencia http://creativecommons.org/licenses/by-nc-sa/4.0/ Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0) application/pdf
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Física
Multilayers
Transparent conductive oxides
spellingShingle Física
Multilayers
Transparent conductive oxides
Valluzzi, Marcos G.
Valluzzi, Lucas G.
Meyer, Marcos
Damonte, Laura Cristina
Opto-electronic characterization of TiO₂/Metal/TiO₂ multilayers
topic_facet Física
Multilayers
Transparent conductive oxides
description Transparent conductive oxides (TCOs) play an important role in many optoelectronic devices such as solar cells, organic light emitting diodes, touch panel and efficiency energy applications, heat mirrors and thermoelectric materials. In recent years, many researchers proposed a TCO/metal/TCO multilayer structure with advanced electrical properties, mechanical flexibility, chemical stability and high optical transparency than a TCO single layer. Multilayer films of TiO₂/Cu/TiO₂ and TiO2/Co/TiO2were grown on glass substrate by DC magnetron sputtering technique at low temperature deposition for low cost applications. Copper interlayer was chosen as a possible replacement of Ag due to their comparable electrical conductivity and relativity low cost. Cobalt interlayer is studied for ferromagnetic properties at room temperature because of its potential applications in spintronics. The deposition time was chosen to obtain estimated thickness for layers of 30 nm while metal interlayers of 12, 15 and 18 nm thick were grown. The optical, electrical, structural and morphological properties of these films were characterized by UV-visible spectroscopy, four probe technique, X-rays diffraction patterns and atomic force microscopy (AFM) respectively. Figures of merit (FOM) are determinate for transparent solar cells electrode and others applications.
format Objeto de conferencia
Objeto de conferencia
author Valluzzi, Marcos G.
Valluzzi, Lucas G.
Meyer, Marcos
Damonte, Laura Cristina
author_facet Valluzzi, Marcos G.
Valluzzi, Lucas G.
Meyer, Marcos
Damonte, Laura Cristina
author_sort Valluzzi, Marcos G.
title Opto-electronic characterization of TiO₂/Metal/TiO₂ multilayers
title_short Opto-electronic characterization of TiO₂/Metal/TiO₂ multilayers
title_full Opto-electronic characterization of TiO₂/Metal/TiO₂ multilayers
title_fullStr Opto-electronic characterization of TiO₂/Metal/TiO₂ multilayers
title_full_unstemmed Opto-electronic characterization of TiO₂/Metal/TiO₂ multilayers
title_sort opto-electronic characterization of tio₂/metal/tio₂ multilayers
publishDate 2017
url http://sedici.unlp.edu.ar/handle/10915/155346
work_keys_str_mv AT valluzzimarcosg optoelectroniccharacterizationoftio2metaltio2multilayers
AT valluzzilucasg optoelectroniccharacterizationoftio2metaltio2multilayers
AT meyermarcos optoelectroniccharacterizationoftio2metaltio2multilayers
AT damontelauracristina optoelectroniccharacterizationoftio2metaltio2multilayers
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