Ellipsometry and electron diffraction study of anodically formed Pd oxide layer

Anodic Pd oxide films grown in l M H<sub>2</sub>SO<sub>4</sub> and l M HClO<sub>4</sub> during the time τ(15s ⩽ τ ⩽ 9000 s) at the potential E<sub>τ</sub>(1.90 V ⩽ E<sub>τ</sub> ⩽ 2.06 V) have been investigated by ellipsometry and electron...

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Autores principales: Bolzán, Agustín Eduardo, Zerbino, Jorge Omar, Macchi, E., Arvia, Alejandro Jorge
Formato: Articulo
Lenguaje:Inglés
Publicado: 1993
Materias:
Ciencias Exactas
Química
Pd oxide layers
Electrochemistry
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/120775
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-120775
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Ciencias Exactas
Química
Pd oxide layers
Electrochemistry
spellingShingle Ciencias Exactas
Química
Pd oxide layers
Electrochemistry
Bolzán, Agustín Eduardo
Zerbino, Jorge Omar
Macchi, E.
Arvia, Alejandro Jorge
Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
topic_facet Ciencias Exactas
Química
Pd oxide layers
Electrochemistry
description Anodic Pd oxide films grown in l M H<sub>2</sub>SO<sub>4</sub> and l M HClO<sub>4</sub> during the time τ(15s ⩽ τ ⩽ 9000 s) at the potential E<sub>τ</sub>(1.90 V ⩽ E<sub>τ</sub> ⩽ 2.06 V) have been investigated by ellipsometry and electron diffraction techniques. Ellipsometry confirms the duplex structure of the anodic Pd oxide films earlier concluded from electrochemical data. Electron diffraction reveals epitaxial growth of PdO on Pd at early stages. The film thickness fits a logarithmic growth rate equation for oxide layer thicknesses greater than 10–20nm, depending on the solution composition.
format Articulo
Articulo
author Bolzán, Agustín Eduardo
Zerbino, Jorge Omar
Macchi, E.
Arvia, Alejandro Jorge
author_facet Bolzán, Agustín Eduardo
Zerbino, Jorge Omar
Macchi, E.
Arvia, Alejandro Jorge
author_sort Bolzán, Agustín Eduardo
title Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_short Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_full Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_fullStr Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_full_unstemmed Ellipsometry and electron diffraction study of anodically formed Pd oxide layer
title_sort ellipsometry and electron diffraction study of anodically formed pd oxide layer
publishDate 1993
url http://sedici.unlp.edu.ar/handle/10915/120775
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AT macchie ellipsometryandelectrondiffractionstudyofanodicallyformedpdoxidelayer
AT arviaalejandrojorge ellipsometryandelectrondiffractionstudyofanodicallyformedpdoxidelayer
bdutipo_str Repositorios
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