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180508t2003 |||a 00 0 eng d |
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|a AR-SjUIP
|c AR-SjUIP
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|a Proyecto Huarpe
|b 6699
|c 6699
|d Proyecto Huarpe
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|a 9780306472923
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|a SCANNING electron microscopy and X-Ray microanalysis /
|c Joseph I. Goldstein ... [et al.].
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|a 3rd ed.
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|a New York :
|b Springer,
|c 2003.
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|a 543.4/.5
|2 UNE 50001:2015
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|a MICROSCOPIA ELECTRONICA
|9 201078
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|a RAYOS X
|9 201079
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|a PROCESAMIENTO DIGITAL DE SEÑALES
|9 201080
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|a Goldstein, Joseph I.
|9 201081
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|a Newbury, Dale E.
|9 200633
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|a xix, 690 p. :
|b il. ;
|c 26 cm. +
|e 1 CD-ROM
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|2 udc
|c LIB
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|c 152857
|d 152857
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