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1por Real, Mariano, Shen, Tian, Jones, George R., Elmquist, Randolph E., Soons, Johannes A., Davydov, Albert V., National Institute of Standards and Technology. NIST. Gaithersburg, US, INTI-Física y Metrología. Buenos Aires, AR, Conference on precision electromagnetic measurements
Publicado 2012conferenceObject -
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3por Elmquist, Randolph E., Shen, Tian, Real, Mariano, Calizo, Irene G., Bush, Brian G., He, Guowei, Yang, Yanfei, Klimov, Nikolai, Newell, David B., Hight-Walker, Angela R., Feenstra, Randall M., National Institute of Standards and Technology. NIST. Gaithersburg, US, INTI-Física y Metrología. Buenos Aires, AR, Carnegie-Mellon University. Pittsburgh, US, Georgetown University. Washington, US, Conference on precision electromagnetic measurements
Publicado 2012conferenceObject