Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
Polymethyl methacrylates
3
Interferometry
2
Ultraviolet radiation
2
EUV lasers
1
EUV lithography
1
Electromagnetic wave diffraction
1
Electrons
1
Extreme ultraviolet lasers
1
Extreme ultraviolet lithography
1
Fresnell zone plate (FZP) lens
1
Interferometric lithography
1
Laser applications
1
Laser source
1
Lasers
1
Lithography
1
Nanopatterning
1
Nanotechnology
1
Pattern recognition
1
Photolithography
1
Photoresists
1
Semiconductor quantum dots
1
Silicon wafers
1
X-ray lasers
1
X-ray lithography
1
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1por Capeluto, M.G., Vaschenko, G., Grisham, M.E., Marconi, M.C., Menoni, C.S., Rocca, J.J., Ludueña, S., Pietrasanta, L., Marcano O. A., Paz J.L.Materias: “...Laser applications...”
CONF -
2por Capeluto, M.G., Vaschenko, G., Grisham, M., Marconi, M.C., Ludueña, S., Pietrasanta, L., Lu, Y., Parkinson, B., Menoni, C.S., Rocca, J.J.Materias: “...X-ray lasers...”
JOUR -
3por Marconi, M.C., Wachulak, P.W., Capeluto, M.G., Vaschenko, G., Bravo, H., Menoni, C.S., Rocca, J., Anderson, E.H., Chao, W., Attwood, D., Hemberg, O., Frazer, B., Bloom, S.Materias: “...Extreme ultraviolet lasers...”
CONF