Shifting of localization planes in optical testing: Application to a shearing interferometer

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An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interfe...

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Detalles Bibliográficos
Autores principales: Simon, J.M., Comastri, S.A., Echarri, R.M.
Formato: JOUR
Materias:
Image processing
Interferometers
Light interference
Prisms
Shearing interferometers
Optical testing
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_1559128X_v40_n28_p4999_Simon
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id todo:paper_1559128X_v40_n28_p4999_Simon
record_format dspace
spelling todo:paper_1559128X_v40_n28_p4999_Simon2023-10-03T16:26:03Z Shifting of localization planes in optical testing: Application to a shearing interferometer Simon, J.M. Comastri, S.A. Echarri, R.M. Image processing Interferometers Light interference Prisms Shearing interferometers Optical testing An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interferometer, the disturbances in a layer can be detected, making its images through the two arms coincide with a chosen localization plane. Different layers can be analyzed by means of shifting the localization plane by a variation of the source period without any other changes in the device. Here we illustrate this method by applying it to a shearing interferometer, a classical Wollaston prism placed between crossed polarizers. Experimental images of different observation planes are obtained, and they are in good agreement with the theoretical expectations. © 2001 Optical Society of America. Fil:Simon, J.M. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Comastri, S.A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Echarri, R.M. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_1559128X_v40_n28_p4999_Simon
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Image processing
Interferometers
Light interference
Prisms
Shearing interferometers
Optical testing
spellingShingle Image processing
Interferometers
Light interference
Prisms
Shearing interferometers
Optical testing
Simon, J.M.
Comastri, S.A.
Echarri, R.M.
Shifting of localization planes in optical testing: Application to a shearing interferometer
topic_facet Image processing
Interferometers
Light interference
Prisms
Shearing interferometers
Optical testing
description An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interferometer, the disturbances in a layer can be detected, making its images through the two arms coincide with a chosen localization plane. Different layers can be analyzed by means of shifting the localization plane by a variation of the source period without any other changes in the device. Here we illustrate this method by applying it to a shearing interferometer, a classical Wollaston prism placed between crossed polarizers. Experimental images of different observation planes are obtained, and they are in good agreement with the theoretical expectations. © 2001 Optical Society of America.
format JOUR
author Simon, J.M.
Comastri, S.A.
Echarri, R.M.
author_facet Simon, J.M.
Comastri, S.A.
Echarri, R.M.
author_sort Simon, J.M.
title Shifting of localization planes in optical testing: Application to a shearing interferometer
title_short Shifting of localization planes in optical testing: Application to a shearing interferometer
title_full Shifting of localization planes in optical testing: Application to a shearing interferometer
title_fullStr Shifting of localization planes in optical testing: Application to a shearing interferometer
title_full_unstemmed Shifting of localization planes in optical testing: Application to a shearing interferometer
title_sort shifting of localization planes in optical testing: application to a shearing interferometer
url http://hdl.handle.net/20.500.12110/paper_1559128X_v40_n28_p4999_Simon
work_keys_str_mv AT simonjm shiftingoflocalizationplanesinopticaltestingapplicationtoashearinginterferometer
AT comastrisa shiftingoflocalizationplanesinopticaltestingapplicationtoashearinginterferometer
AT echarrirm shiftingoflocalizationplanesinopticaltestingapplicationtoashearinginterferometer
_version_ 1807316936939274240

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