Localised electrochemical impedance spectroscopy with high lateral resolution by means of alternating current scanning electrochemical microscopy
A new method for measuring local interfacial impedance properties with high lateral resolution was developed by combination of electrochemical impedance spectroscopy (EIS) with scanning electrochemical microscopy (SECM). Alternating current scanning electrochemical microscopy (AC-SECM) allowed to id...
Guardado en:
Autores principales: | Ballesteros Katemann, B., Schulte, A., Calvo, E.J., Koudelka-Hep, M., Schuhmann, W. |
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Formato: | JOUR |
Materias: | |
Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_13882481_v4_n2_p134_BallesterosKatemann |
Aporte de: |
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