Soft-x-ray interferometer for single-shot laser linewidth measurements

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A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of...

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Autores principales: Chilla, J.L.A., Rocca, J.J., Martinez, O.E., Marconi, M.C.
Formato: JOUR
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_01469592_v21_n13_p955_Chilla
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Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id todo:paper_01469592_v21_n13_p955_Chilla
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spelling todo:paper_01469592_v21_n13_p955_Chilla2023-10-03T15:00:18Z Soft-x-ray interferometer for single-shot laser linewidth measurements Chilla, J.L.A. Rocca, J.J. Martinez, O.E. Marconi, M.C. A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed. © 1996 Optical Society of America. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_01469592_v21_n13_p955_Chilla
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
description A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed. © 1996 Optical Society of America.
format JOUR
author Chilla, J.L.A.
Rocca, J.J.
Martinez, O.E.
Marconi, M.C.
spellingShingle Chilla, J.L.A.
Rocca, J.J.
Martinez, O.E.
Marconi, M.C.
Soft-x-ray interferometer for single-shot laser linewidth measurements
author_facet Chilla, J.L.A.
Rocca, J.J.
Martinez, O.E.
Marconi, M.C.
author_sort Chilla, J.L.A.
title Soft-x-ray interferometer for single-shot laser linewidth measurements
title_short Soft-x-ray interferometer for single-shot laser linewidth measurements
title_full Soft-x-ray interferometer for single-shot laser linewidth measurements
title_fullStr Soft-x-ray interferometer for single-shot laser linewidth measurements
title_full_unstemmed Soft-x-ray interferometer for single-shot laser linewidth measurements
title_sort soft-x-ray interferometer for single-shot laser linewidth measurements
url http://hdl.handle.net/20.500.12110/paper_01469592_v21_n13_p955_Chilla
work_keys_str_mv AT chillajla softxrayinterferometerforsingleshotlaserlinewidthmeasurements
AT roccajj softxrayinterferometerforsingleshotlaserlinewidthmeasurements
AT martinezoe softxrayinterferometerforsingleshotlaserlinewidthmeasurements
AT marconimc softxrayinterferometerforsingleshotlaserlinewidthmeasurements
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