On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results

The first study of Langmuir probes applied to cutting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is regis...

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Detalles Bibliográficos
Autores principales: Prevosto, L., Kelly, H., Mancinelli, B.
Formato: JOUR
Materias:
Cutting arcs
Langmuir probes
Plasma diagnostic
Electric currents
Electron emission
Plasma diagnostics
Sweeping-probe system
Plasma arc cutting
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00933813_v36PART2_n1_p263_Prevosto
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id todo:paper_00933813_v36PART2_n1_p263_Prevosto
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spelling todo:paper_00933813_v36PART2_n1_p263_Prevosto2023-10-03T14:55:33Z On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results Prevosto, L. Kelly, H. Mancinelli, B. Cutting arcs Langmuir probes Plasma diagnostic Electric currents Electron emission Langmuir probes Plasma diagnostics Cutting arcs Sweeping-probe system Plasma arc cutting The first study of Langmuir probes applied to cutting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is registered, notwithstanding the large value of the power flux present with these arcs. In practice, probes with radii down to 63 μm and with sweeping rotation frequencies down to 8.7 s -1 (probe transit time of ≈140 μs through the arc) were used without noticeable alterations. In the measurements of the ion current collected by negatively biased probes, the following two unexpected features are found: the lack of a current plateau in the ion branch of the I-V probe characteristic and the independence of the signal amplitude on the probe radius. According to the experimental evidence, as well as several estimations, we have neglected electron emission of the probe surface as a relevant mechanism in modifying the ion branch of the characteristic. On the contrary, some arguments on which a collection model will be based are presented. © 2008 IEEE. Fil:Kelly, H. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00933813_v36PART2_n1_p263_Prevosto
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Cutting arcs
Langmuir probes
Plasma diagnostic
Electric currents
Electron emission
Langmuir probes
Plasma diagnostics
Cutting arcs
Sweeping-probe system
Plasma arc cutting
spellingShingle Cutting arcs
Langmuir probes
Plasma diagnostic
Electric currents
Electron emission
Langmuir probes
Plasma diagnostics
Cutting arcs
Sweeping-probe system
Plasma arc cutting
Prevosto, L.
Kelly, H.
Mancinelli, B.
On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
topic_facet Cutting arcs
Langmuir probes
Plasma diagnostic
Electric currents
Electron emission
Langmuir probes
Plasma diagnostics
Cutting arcs
Sweeping-probe system
Plasma arc cutting
description The first study of Langmuir probes applied to cutting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is registered, notwithstanding the large value of the power flux present with these arcs. In practice, probes with radii down to 63 μm and with sweeping rotation frequencies down to 8.7 s -1 (probe transit time of ≈140 μs through the arc) were used without noticeable alterations. In the measurements of the ion current collected by negatively biased probes, the following two unexpected features are found: the lack of a current plateau in the ion branch of the I-V probe characteristic and the independence of the signal amplitude on the probe radius. According to the experimental evidence, as well as several estimations, we have neglected electron emission of the probe surface as a relevant mechanism in modifying the ion branch of the characteristic. On the contrary, some arguments on which a collection model will be based are presented. © 2008 IEEE.
format JOUR
author Prevosto, L.
Kelly, H.
Mancinelli, B.
author_facet Prevosto, L.
Kelly, H.
Mancinelli, B.
author_sort Prevosto, L.
title On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_short On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_full On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_fullStr On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_full_unstemmed On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_sort on the use of sweeping langmuir probes in cutting arc plasmas - part i: experimental results
url http://hdl.handle.net/20.500.12110/paper_00933813_v36PART2_n1_p263_Prevosto
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AT kellyh ontheuseofsweepinglangmuirprobesincuttingarcplasmaspartiexperimentalresults
AT mancinellib ontheuseofsweepinglangmuirprobesincuttingarcplasmaspartiexperimentalresults
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