Aberrations in plane grating spectrometers

The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making us...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Gil, M.A., Simon, J.M.
Formato: JOUR
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil
Aporte de:
id todo:paper_00303909_v30_n6_p777_Gil
record_format dspace
spelling todo:paper_00303909_v30_n6_p777_Gil2023-10-03T14:39:54Z Aberrations in plane grating spectrometers Gil, M.A. Simon, J.M. The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making use of the opportunity provided by the method, the aberrations in each system are rapidly analysed in order to make a first selection among the designs under consideration. The analytical results are compared with those obtained by ray tracing. The study shows clearly the optimal field of application of each design. © 1983 Taylor and Francis Group, LLC. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
description The aberrations of off-axis plane grating spectrometers with one mirror in the camera and another in the collimator are calculated by means of the plate diagram method. Spectrometers in the Z and U configurations with spherical, centred parabolic and off-axis parabolic mirrors are studied. Making use of the opportunity provided by the method, the aberrations in each system are rapidly analysed in order to make a first selection among the designs under consideration. The analytical results are compared with those obtained by ray tracing. The study shows clearly the optimal field of application of each design. © 1983 Taylor and Francis Group, LLC.
format JOUR
author Gil, M.A.
Simon, J.M.
spellingShingle Gil, M.A.
Simon, J.M.
Aberrations in plane grating spectrometers
author_facet Gil, M.A.
Simon, J.M.
author_sort Gil, M.A.
title Aberrations in plane grating spectrometers
title_short Aberrations in plane grating spectrometers
title_full Aberrations in plane grating spectrometers
title_fullStr Aberrations in plane grating spectrometers
title_full_unstemmed Aberrations in plane grating spectrometers
title_sort aberrations in plane grating spectrometers
url http://hdl.handle.net/20.500.12110/paper_00303909_v30_n6_p777_Gil
work_keys_str_mv AT gilma aberrationsinplanegratingspectrometers
AT simonjm aberrationsinplanegratingspectrometers
_version_ 1782024420390338560