Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa<inf>2</inf>Cu<inf>3</inf>O<inf>7-</inf><inf>δ</inf> (optimally doped YBCO) interfaces have been studied at different resistance states. These...
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| Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_00218979_v118_n4_p_Schulman |
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todo:paper_00218979_v118_n4_p_Schulman2023-10-03T14:22:16Z Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices Schulman, A. Lanosa, L.F. Acha, C. Switching systems Temperature distribution Yttrium barium copper oxides Electrical conduction Electrical transport Poole-Frenkel effect Poole-Frenkel emission Resistive switching devices Temperature dependence Variable range hopping Variable-range hopping conduction Interface states Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa<inf>2</inf>Cu<inf>3</inf>O<inf>7-</inf><inf>δ</inf> (optimally doped YBCO) interfaces have been studied at different resistance states. These states were produced by resistive switching after accumulating cyclic electrical pulses of increasing number and voltage amplitude. The IV characteristics and the R(T) dependence of the different states are consistent with a Poole-Frenkel (P-F) emission mechanism with trapping-energy levels E<inf>t</inf> in the 0.06-0.11 V range. E<inf>t</inf> remains constant up to a number-of-pulses-dependent critical voltage and increases linearly with a further increase in the voltage amplitude of the pulses. The observation of a P-F mechanism reveals the existence of an oxygen-depleted layer of YBCO near the interface. A simple electrical transport scenario is discussed, where the degree of disorder, the trap energy level, and the temperature range determine an electrical conduction dominated by non-linear effects, either in a P-F emission or in a variable-range hopping regime. © 2015 AIP Publishing LLC. Fil:Acha, C. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00218979_v118_n4_p_Schulman |
| institution |
Universidad de Buenos Aires |
| institution_str |
I-28 |
| repository_str |
R-134 |
| collection |
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
| topic |
Switching systems Temperature distribution Yttrium barium copper oxides Electrical conduction Electrical transport Poole-Frenkel effect Poole-Frenkel emission Resistive switching devices Temperature dependence Variable range hopping Variable-range hopping conduction Interface states |
| spellingShingle |
Switching systems Temperature distribution Yttrium barium copper oxides Electrical conduction Electrical transport Poole-Frenkel effect Poole-Frenkel emission Resistive switching devices Temperature dependence Variable range hopping Variable-range hopping conduction Interface states Schulman, A. Lanosa, L.F. Acha, C. Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices |
| topic_facet |
Switching systems Temperature distribution Yttrium barium copper oxides Electrical conduction Electrical transport Poole-Frenkel effect Poole-Frenkel emission Resistive switching devices Temperature dependence Variable range hopping Variable-range hopping conduction Interface states |
| description |
Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa<inf>2</inf>Cu<inf>3</inf>O<inf>7-</inf><inf>δ</inf> (optimally doped YBCO) interfaces have been studied at different resistance states. These states were produced by resistive switching after accumulating cyclic electrical pulses of increasing number and voltage amplitude. The IV characteristics and the R(T) dependence of the different states are consistent with a Poole-Frenkel (P-F) emission mechanism with trapping-energy levels E<inf>t</inf> in the 0.06-0.11 V range. E<inf>t</inf> remains constant up to a number-of-pulses-dependent critical voltage and increases linearly with a further increase in the voltage amplitude of the pulses. The observation of a P-F mechanism reveals the existence of an oxygen-depleted layer of YBCO near the interface. A simple electrical transport scenario is discussed, where the degree of disorder, the trap energy level, and the temperature range determine an electrical conduction dominated by non-linear effects, either in a P-F emission or in a variable-range hopping regime. © 2015 AIP Publishing LLC. |
| format |
JOUR |
| author |
Schulman, A. Lanosa, L.F. Acha, C. |
| author_facet |
Schulman, A. Lanosa, L.F. Acha, C. |
| author_sort |
Schulman, A. |
| title |
Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices |
| title_short |
Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices |
| title_full |
Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices |
| title_fullStr |
Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices |
| title_full_unstemmed |
Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices |
| title_sort |
poole-frenkel effect and variable-range hopping conduction in metal/ybco resistive switching devices |
| url |
http://hdl.handle.net/20.500.12110/paper_00218979_v118_n4_p_Schulman |
| work_keys_str_mv |
AT schulmana poolefrenkeleffectandvariablerangehoppingconductioninmetalybcoresistiveswitchingdevices AT lanosalf poolefrenkeleffectandvariablerangehoppingconductioninmetalybcoresistiveswitchingdevices AT achac poolefrenkeleffectandvariablerangehoppingconductioninmetalybcoresistiveswitchingdevices |
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