Cyclic electric field stress on bipolar resistive switching devices
We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied p...
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| Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman |
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todo:paper_00218979_v114_n24_p_Schulman2023-10-03T14:22:15Z Cyclic electric field stress on bipolar resistive switching devices Schulman, A. Acha, C. Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied pulses N on the relative amplitude of the remnant resistance change between the high (RH) and the low (R L) state [( = (R H-R L) / R L] at different temperatures (T). We show that the critical voltage (Vc) needed to produce a resistive switching (RS, i.e., > 0) decreases with increasing N or T. We also find a power law relation between the voltage of the pulses and the number of pulses N 0 required to produce a RS of = 0. This relation remains very similar to the Basquin equation used to describe the stress-fatigue lifetime curves in mechanical tests. This points out to the similarity between the physics of the RS, associated with the diffusion of oxygen vacancies induced by electrical pulses, and the propagation of defects in materials subjected to repeated mechanical stress. © 2013 AIP Publishing LLC. Fil:Acha, C. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman |
| institution |
Universidad de Buenos Aires |
| institution_str |
I-28 |
| repository_str |
R-134 |
| collection |
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
| topic |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses |
| spellingShingle |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses Schulman, A. Acha, C. Cyclic electric field stress on bipolar resistive switching devices |
| topic_facet |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses |
| description |
We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied pulses N on the relative amplitude of the remnant resistance change between the high (RH) and the low (R L) state [( = (R H-R L) / R L] at different temperatures (T). We show that the critical voltage (Vc) needed to produce a resistive switching (RS, i.e., > 0) decreases with increasing N or T. We also find a power law relation between the voltage of the pulses and the number of pulses N 0 required to produce a RS of = 0. This relation remains very similar to the Basquin equation used to describe the stress-fatigue lifetime curves in mechanical tests. This points out to the similarity between the physics of the RS, associated with the diffusion of oxygen vacancies induced by electrical pulses, and the propagation of defects in materials subjected to repeated mechanical stress. © 2013 AIP Publishing LLC. |
| format |
JOUR |
| author |
Schulman, A. Acha, C. |
| author_facet |
Schulman, A. Acha, C. |
| author_sort |
Schulman, A. |
| title |
Cyclic electric field stress on bipolar resistive switching devices |
| title_short |
Cyclic electric field stress on bipolar resistive switching devices |
| title_full |
Cyclic electric field stress on bipolar resistive switching devices |
| title_fullStr |
Cyclic electric field stress on bipolar resistive switching devices |
| title_full_unstemmed |
Cyclic electric field stress on bipolar resistive switching devices |
| title_sort |
cyclic electric field stress on bipolar resistive switching devices |
| url |
http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman |
| work_keys_str_mv |
AT schulmana cyclicelectricfieldstressonbipolarresistiveswitchingdevices AT achac cyclicelectricfieldstressonbipolarresistiveswitchingdevices |
| _version_ |
1782027176391999488 |