Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil pro...
Guardado en:
Publicado: |
2016
|
---|---|
Materias: | |
Acceso en línea: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_20724292_v8_n6_p_Barber http://hdl.handle.net/20.500.12110/paper_20724292_v8_n6_p_Barber |
Aporte de: |
id |
paper:paper_20724292_v8_n6_p_Barber |
---|---|
record_format |
dspace |
spelling |
paper:paper_20724292_v8_n6_p_Barber2023-06-08T16:34:10Z Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces Correlation length Height standard deviation Laser profiler Radar applications Scattering models Surface soil roughness Agriculture Backscattering Parameter estimation Soils Surface roughness Correlation lengths Laser profilers Radar applications Scattering model Standard deviation Surface soil Soil surveys The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil profiles have continuous spectral components, it is clear that roughness parameters are influenced by the sampling interval of the measurement device employed. In this work, we contributed to answer which sampling interval the profiles needed to be measured at to accurately account for the microwave response of agricultural surfaces. For this purpose, a 2-D laser profiler was built and used to measure surface soil roughness at field scale over agricultural sites in Argentina. Sampling intervals ranged from large (50 mm) to small ones (1 mm), with several intermediate values. Large- and intermediate-sampling-interval profiles were synthetically derived from nominal, 1 mm ones. With these data, the effect of sampling-interval-dependent roughness parameters on backscatter response was assessed using the theoretical backscatter model IEM2M. Simulations demonstrated that variations of roughness parameters depended on the working wavelength and was less important at L-band than at C- or X-band. In any case, an underestimation of the backscattering coefficient of about 1-4 dB was observed at larger sampling intervals. As a general rule a sampling interval of 15 mm can be recommended for L-band and 5 mm for C-band. 2016 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_20724292_v8_n6_p_Barber http://hdl.handle.net/20.500.12110/paper_20724292_v8_n6_p_Barber |
institution |
Universidad de Buenos Aires |
institution_str |
I-28 |
repository_str |
R-134 |
collection |
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
topic |
Correlation length Height standard deviation Laser profiler Radar applications Scattering models Surface soil roughness Agriculture Backscattering Parameter estimation Soils Surface roughness Correlation lengths Laser profilers Radar applications Scattering model Standard deviation Surface soil Soil surveys |
spellingShingle |
Correlation length Height standard deviation Laser profiler Radar applications Scattering models Surface soil roughness Agriculture Backscattering Parameter estimation Soils Surface roughness Correlation lengths Laser profilers Radar applications Scattering model Standard deviation Surface soil Soil surveys Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces |
topic_facet |
Correlation length Height standard deviation Laser profiler Radar applications Scattering models Surface soil roughness Agriculture Backscattering Parameter estimation Soils Surface roughness Correlation lengths Laser profilers Radar applications Scattering model Standard deviation Surface soil Soil surveys |
description |
The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil profiles have continuous spectral components, it is clear that roughness parameters are influenced by the sampling interval of the measurement device employed. In this work, we contributed to answer which sampling interval the profiles needed to be measured at to accurately account for the microwave response of agricultural surfaces. For this purpose, a 2-D laser profiler was built and used to measure surface soil roughness at field scale over agricultural sites in Argentina. Sampling intervals ranged from large (50 mm) to small ones (1 mm), with several intermediate values. Large- and intermediate-sampling-interval profiles were synthetically derived from nominal, 1 mm ones. With these data, the effect of sampling-interval-dependent roughness parameters on backscatter response was assessed using the theoretical backscatter model IEM2M. Simulations demonstrated that variations of roughness parameters depended on the working wavelength and was less important at L-band than at C- or X-band. In any case, an underestimation of the backscattering coefficient of about 1-4 dB was observed at larger sampling intervals. As a general rule a sampling interval of 15 mm can be recommended for L-band and 5 mm for C-band. |
title |
Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces |
title_short |
Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces |
title_full |
Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces |
title_fullStr |
Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces |
title_full_unstemmed |
Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces |
title_sort |
effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces |
publishDate |
2016 |
url |
https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_20724292_v8_n6_p_Barber http://hdl.handle.net/20.500.12110/paper_20724292_v8_n6_p_Barber |
_version_ |
1768541678498480128 |