Shifting of localization planes in optical testing: Application to a shearing interferometer

An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interfe...

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Detalles Bibliográficos
Autores principales:	Simon, Juan Miguel, Comastri, Silvia Ana Elba, Echarri, Rodolfo Manuel
Publicado:	2001
Materias:	Image processing Interferometers Light interference Prisms Shearing interferometers Optical testing
Acceso en línea:	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_1559128X_v40_n28_p4999_Simon http://hdl.handle.net/20.500.12110/paper_1559128X_v40_n28_p4999_Simon
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

id	paper:paper_1559128X_v40_n28_p4999_Simon
record_format	dspace
spelling	paper:paper_1559128X_v40_n28_p4999_Simon2023-06-08T16:23:36Z Shifting of localization planes in optical testing: Application to a shearing interferometer Simon, Juan Miguel Comastri, Silvia Ana Elba Echarri, Rodolfo Manuel Image processing Interferometers Light interference Prisms Shearing interferometers Optical testing An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interferometer, the disturbances in a layer can be detected, making its images through the two arms coincide with a chosen localization plane. Different layers can be analyzed by means of shifting the localization plane by a variation of the source period without any other changes in the device. Here we illustrate this method by applying it to a shearing interferometer, a classical Wollaston prism placed between crossed polarizers. Experimental images of different observation planes are obtained, and they are in good agreement with the theoretical expectations. © 2001 Optical Society of America. Fil:Simon, J.M. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Comastri, S.A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Echarri, R.M. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. 2001 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_1559128X_v40_n28_p4999_Simon http://hdl.handle.net/20.500.12110/paper_1559128X_v40_n28_p4999_Simon
institution	Universidad de Buenos Aires
institution_str	I-28
repository_str	R-134
collection	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic	Image processing Interferometers Light interference Prisms Shearing interferometers Optical testing
spellingShingle	Image processing Interferometers Light interference Prisms Shearing interferometers Optical testing Simon, Juan Miguel Comastri, Silvia Ana Elba Echarri, Rodolfo Manuel Shifting of localization planes in optical testing: Application to a shearing interferometer
topic_facet	Image processing Interferometers Light interference Prisms Shearing interferometers Optical testing
description	An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interferometer, the disturbances in a layer can be detected, making its images through the two arms coincide with a chosen localization plane. Different layers can be analyzed by means of shifting the localization plane by a variation of the source period without any other changes in the device. Here we illustrate this method by applying it to a shearing interferometer, a classical Wollaston prism placed between crossed polarizers. Experimental images of different observation planes are obtained, and they are in good agreement with the theoretical expectations. © 2001 Optical Society of America.
author	Simon, Juan Miguel Comastri, Silvia Ana Elba Echarri, Rodolfo Manuel
author_facet	Simon, Juan Miguel Comastri, Silvia Ana Elba Echarri, Rodolfo Manuel
author_sort	Simon, Juan Miguel
title	Shifting of localization planes in optical testing: Application to a shearing interferometer
title_short	Shifting of localization planes in optical testing: Application to a shearing interferometer
title_full	Shifting of localization planes in optical testing: Application to a shearing interferometer
title_fullStr	Shifting of localization planes in optical testing: Application to a shearing interferometer
title_full_unstemmed	Shifting of localization planes in optical testing: Application to a shearing interferometer
title_sort	shifting of localization planes in optical testing: application to a shearing interferometer
publishDate	2001
url	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_1559128X_v40_n28_p4999_Simon http://hdl.handle.net/20.500.12110/paper_1559128X_v40_n28_p4999_Simon
work_keys_str_mv	AT simonjuanmiguel shiftingoflocalizationplanesinopticaltestingapplicationtoashearinginterferometer AT comastrisilviaanaelba shiftingoflocalizationplanesinopticaltestingapplicationtoashearinginterferometer AT echarrirodolfomanuel shiftingoflocalizationplanesinopticaltestingapplicationtoashearinginterferometer
_version_	1768542569389621248

Shifting of localization planes in optical testing: Application to a shearing interferometer

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