Soft-x-ray interferometer for single-shot laser linewidth measurements

A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of...

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Detalles Bibliográficos
Publicado: 1996
Acceso en línea:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_01469592_v21_n13_p955_Chilla
http://hdl.handle.net/20.500.12110/paper_01469592_v21_n13_p955_Chilla
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Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id paper:paper_01469592_v21_n13_p955_Chilla
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spelling paper:paper_01469592_v21_n13_p955_Chilla2025-07-30T17:51:52Z Soft-x-ray interferometer for single-shot laser linewidth measurements A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed. © 1996 Optical Society of America. 1996 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_01469592_v21_n13_p955_Chilla http://hdl.handle.net/20.500.12110/paper_01469592_v21_n13_p955_Chilla
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
description A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed. © 1996 Optical Society of America.
title Soft-x-ray interferometer for single-shot laser linewidth measurements
spellingShingle Soft-x-ray interferometer for single-shot laser linewidth measurements
title_short Soft-x-ray interferometer for single-shot laser linewidth measurements
title_full Soft-x-ray interferometer for single-shot laser linewidth measurements
title_fullStr Soft-x-ray interferometer for single-shot laser linewidth measurements
title_full_unstemmed Soft-x-ray interferometer for single-shot laser linewidth measurements
title_sort soft-x-ray interferometer for single-shot laser linewidth measurements
publishDate 1996
url https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_01469592_v21_n13_p955_Chilla
http://hdl.handle.net/20.500.12110/paper_01469592_v21_n13_p955_Chilla
_version_ 1840323271122223104

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