Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode

The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N2 pressure is reported. A Faraday Cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scatter...

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Autores principales: Kelly, Héctor Juan, Lepone, Francisco Alejandro, Marquez, Adriana B.
Publicado: 1998
Materias:
Faraday cup diagnostic
Ion beams
Ion energy spectral analysis
Plasma focus
Electron emission
Nitrogen
Plasma diagnostics
Spectrum analysis
Faraday cup diagnostics
Plasma focus (PF) devices
Plasma devices
Acceso en línea:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00933813_v26_n1_p113_Kelly
http://hdl.handle.net/20.500.12110/paper_00933813_v26_n1_p113_Kelly
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Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id paper:paper_00933813_v26_n1_p113_Kelly
record_format dspace
spelling paper:paper_00933813_v26_n1_p113_Kelly2023-06-08T15:08:35Z Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode Kelly, Héctor Juan Lepone, Francisco Alejandro Marquez, Adriana B. Faraday cup diagnostic Ion beams Ion energy spectral analysis Plasma focus Electron emission Ion beams Nitrogen Plasma diagnostics Spectrum analysis Faraday cup diagnostics Plasma focus (PF) devices Plasma devices The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N2 pressure is reported. A Faraday Cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scattering of the ions was taken into account. It has been possible to register the ion energy up to a lower kinetic energy threshold of 50 keV, which is a value much lower than that obtained with a Thomson spectrometer in a previous work. © 1998 IEEE. Fil:Kelly, H. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Lepone, A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Marquez, A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. 1998 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00933813_v26_n1_p113_Kelly http://hdl.handle.net/20.500.12110/paper_00933813_v26_n1_p113_Kelly
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Faraday cup diagnostic
Ion beams
Ion energy spectral analysis
Plasma focus
Electron emission
Ion beams
Nitrogen
Plasma diagnostics
Spectrum analysis
Faraday cup diagnostics
Plasma focus (PF) devices
Plasma devices
spellingShingle Faraday cup diagnostic
Ion beams
Ion energy spectral analysis
Plasma focus
Electron emission
Ion beams
Nitrogen
Plasma diagnostics
Spectrum analysis
Faraday cup diagnostics
Plasma focus (PF) devices
Plasma devices
Kelly, Héctor Juan
Lepone, Francisco Alejandro
Marquez, Adriana B.
Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
topic_facet Faraday cup diagnostic
Ion beams
Ion energy spectral analysis
Plasma focus
Electron emission
Ion beams
Nitrogen
Plasma diagnostics
Spectrum analysis
Faraday cup diagnostics
Plasma focus (PF) devices
Plasma devices
description The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N2 pressure is reported. A Faraday Cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scattering of the ions was taken into account. It has been possible to register the ion energy up to a lower kinetic energy threshold of 50 keV, which is a value much lower than that obtained with a Thomson spectrometer in a previous work. © 1998 IEEE.
author Kelly, Héctor Juan
Lepone, Francisco Alejandro
Marquez, Adriana B.
author_facet Kelly, Héctor Juan
Lepone, Francisco Alejandro
Marquez, Adriana B.
author_sort Kelly, Héctor Juan
title Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
title_short Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
title_full Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
title_fullStr Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
title_full_unstemmed Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
title_sort analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
publishDate 1998
url https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00933813_v26_n1_p113_Kelly
http://hdl.handle.net/20.500.12110/paper_00933813_v26_n1_p113_Kelly
work_keys_str_mv AT kellyhectorjuan analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode
AT leponefranciscoalejandro analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode
AT marquezadrianab analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode
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