Simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis

High frequency rheological properties of polymer films have been measured using a nonadditive quartz crystal resonator impedance approach. The method involves fast measurement of the quartz covered with the film in contact with solutions of different viscosities and the measurement of the equivalent...

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Publicado: 1999
Acceso en línea:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00218979_v86_n4_p1994_Etchenique
http://hdl.handle.net/20.500.12110/paper_00218979_v86_n4_p1994_Etchenique
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Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
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spelling paper:paper_00218979_v86_n4_p1994_Etchenique2023-06-08T14:42:54Z Simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis High frequency rheological properties of polymer films have been measured using a nonadditive quartz crystal resonator impedance approach. The method involves fast measurement of the quartz covered with the film in contact with solutions of different viscosities and the measurement of the equivalent impedance of the bare quartz resonator in contact with the same solutions. Although by using a standard quartz crystal acoustic impedance method it is not possible to determine more than two of the four film parameters (density, thickness, storage modulus G′, and loss modulus G″), we demonstrate that the interaction between the film under study and a semi-infinite layer of liquid gives the additional information needed to get the mechanical moduli G′ and G″ simultaneously with the mass or thickness of the film. An alternative approach to measure G′ and G″, which involves independent and very precise determination of the film thickness, is discussed. Experimental measurements of polystyrene using dioctyl phthalate as a plasticizer show excellent agreement with Martin's model for quartz resonators covered with viscoelastic nonpiezoelectric layers. The results demonstrate that quartz resonators can be used to measure high frequency rheological properties of films simply without the need of an independent measurement of thickness. © 1999 American Institute of Physics. 1999 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00218979_v86_n4_p1994_Etchenique http://hdl.handle.net/20.500.12110/paper_00218979_v86_n4_p1994_Etchenique
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
description High frequency rheological properties of polymer films have been measured using a nonadditive quartz crystal resonator impedance approach. The method involves fast measurement of the quartz covered with the film in contact with solutions of different viscosities and the measurement of the equivalent impedance of the bare quartz resonator in contact with the same solutions. Although by using a standard quartz crystal acoustic impedance method it is not possible to determine more than two of the four film parameters (density, thickness, storage modulus G′, and loss modulus G″), we demonstrate that the interaction between the film under study and a semi-infinite layer of liquid gives the additional information needed to get the mechanical moduli G′ and G″ simultaneously with the mass or thickness of the film. An alternative approach to measure G′ and G″, which involves independent and very precise determination of the film thickness, is discussed. Experimental measurements of polystyrene using dioctyl phthalate as a plasticizer show excellent agreement with Martin's model for quartz resonators covered with viscoelastic nonpiezoelectric layers. The results demonstrate that quartz resonators can be used to measure high frequency rheological properties of films simply without the need of an independent measurement of thickness. © 1999 American Institute of Physics.
title Simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis
spellingShingle Simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis
title_short Simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis
title_full Simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis
title_fullStr Simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis
title_full_unstemmed Simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis
title_sort simultaneous determination of the mechanical moduli and mass of thin layers using nonadditive quartz crystal acoustic impedance analysis
publishDate 1999
url https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00218979_v86_n4_p1994_Etchenique
http://hdl.handle.net/20.500.12110/paper_00218979_v86_n4_p1994_Etchenique
_version_ 1768544394896474112

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