On the effect of noise and electronics bandwidth on a stochastic-resonance memory device
We recently showed that a ring of two bistable oscillators is capable of storing a single bit of information via stochastic resonance. Memory performance was characterized in terms of the probability of erroneous bit detection and was shown to be minimized for a range of noise intensities. Furthermo...
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2011
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Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_0094243X_v1339_n_p298_Fierens http://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=artiaex&d=paper_0094243X_v1339_n_p298_Fierens_oai |
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I28-R145-paper_0094243X_v1339_n_p298_Fierens_oai2020-10-19 Fierens, P.I. Patterson, G.A. Bellomo, G. Grosz, D.F. 2011 We recently showed that a ring of two bistable oscillators is capable of storing a single bit of information via stochastic resonance. Memory performance was characterized in terms of the probability of erroneous bit detection and was shown to be minimized for a range of noise intensities. Furthermore, memory persistence was also shown to exhibit a stochastic-resonance behavior. In this paper we investigate the influence on memory performance, in particular its resilience to noise, on both noise bandwidth and the limited time response of the bistable elements. We show that, for broad ranges of ST and noise bandwidths, the probability of erroneous bit retrieval is also minimized for an optimal noise intensity, exhibiting a deep well as a function of noise intensity. We are interested in the breadth of such a well as it points out to the robustness of the memory device under different working conditions. Moreover, we show that there exists a relation between the noise and ST bandwidths that favors wide wells. We believe that this relation may be of relevance as a design rule for practical memory devices sustained by noise. © 2011 American Institute of Physics. Fil:Grosz, D.F. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. application/pdf http://hdl.handle.net/20.500.12110/paper_0094243X_v1339_n_p298_Fierens info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar AIP Conf. Proc. 2011;1339:298-302 Memory device Stochastic resonance On the effect of noise and electronics bandwidth on a stochastic-resonance memory device info:eu-repo/semantics/conferenceObject info:ar-repo/semantics/documento de conferencia info:eu-repo/semantics/publishedVersion http://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=artiaex&d=paper_0094243X_v1339_n_p298_Fierens_oai |
institution |
Universidad de Buenos Aires |
institution_str |
I-28 |
repository_str |
R-145 |
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Repositorio Digital de la Universidad de Buenos Aires (UBA) |
topic |
Memory device Stochastic resonance |
spellingShingle |
Memory device Stochastic resonance Fierens, P.I. Patterson, G.A. Bellomo, G. Grosz, D.F. On the effect of noise and electronics bandwidth on a stochastic-resonance memory device |
topic_facet |
Memory device Stochastic resonance |
description |
We recently showed that a ring of two bistable oscillators is capable of storing a single bit of information via stochastic resonance. Memory performance was characterized in terms of the probability of erroneous bit detection and was shown to be minimized for a range of noise intensities. Furthermore, memory persistence was also shown to exhibit a stochastic-resonance behavior. In this paper we investigate the influence on memory performance, in particular its resilience to noise, on both noise bandwidth and the limited time response of the bistable elements. We show that, for broad ranges of ST and noise bandwidths, the probability of erroneous bit retrieval is also minimized for an optimal noise intensity, exhibiting a deep well as a function of noise intensity. We are interested in the breadth of such a well as it points out to the robustness of the memory device under different working conditions. Moreover, we show that there exists a relation between the noise and ST bandwidths that favors wide wells. We believe that this relation may be of relevance as a design rule for practical memory devices sustained by noise. © 2011 American Institute of Physics. |
format |
Documento de conferencia Documento de conferencia publishedVersion |
author |
Fierens, P.I. Patterson, G.A. Bellomo, G. Grosz, D.F. |
author_facet |
Fierens, P.I. Patterson, G.A. Bellomo, G. Grosz, D.F. |
author_sort |
Fierens, P.I. |
title |
On the effect of noise and electronics bandwidth on a stochastic-resonance memory device |
title_short |
On the effect of noise and electronics bandwidth on a stochastic-resonance memory device |
title_full |
On the effect of noise and electronics bandwidth on a stochastic-resonance memory device |
title_fullStr |
On the effect of noise and electronics bandwidth on a stochastic-resonance memory device |
title_full_unstemmed |
On the effect of noise and electronics bandwidth on a stochastic-resonance memory device |
title_sort |
on the effect of noise and electronics bandwidth on a stochastic-resonance memory device |
publishDate |
2011 |
url |
http://hdl.handle.net/20.500.12110/paper_0094243X_v1339_n_p298_Fierens http://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=artiaex&d=paper_0094243X_v1339_n_p298_Fierens_oai |
work_keys_str_mv |
AT fierenspi ontheeffectofnoiseandelectronicsbandwidthonastochasticresonancememorydevice AT pattersonga ontheeffectofnoiseandelectronicsbandwidthonastochasticresonancememorydevice AT bellomog ontheeffectofnoiseandelectronicsbandwidthonastochasticresonancememorydevice AT groszdf ontheeffectofnoiseandelectronicsbandwidthonastochasticresonancememorydevice |
_version_ |
1766026645971402752 |