Cyclic electric field stress on bipolar resistive switching devices
We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied p...
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| Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman http://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=artiaex&d=paper_00218979_v114_n24_p_Schulman_oai |
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I28-R145-paper_00218979_v114_n24_p_Schulman_oai2020-10-19 Schulman, A. Acha, C. 2013 We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied pulses N on the relative amplitude of the remnant resistance change between the high (RH) and the low (R L) state [( = (R H-R L) / R L] at different temperatures (T). We show that the critical voltage (Vc) needed to produce a resistive switching (RS, i.e., > 0) decreases with increasing N or T. We also find a power law relation between the voltage of the pulses and the number of pulses N 0 required to produce a RS of = 0. This relation remains very similar to the Basquin equation used to describe the stress-fatigue lifetime curves in mechanical tests. This points out to the similarity between the physics of the RS, associated with the diffusion of oxygen vacancies induced by electrical pulses, and the propagation of defects in materials subjected to repeated mechanical stress. © 2013 AIP Publishing LLC. Fil:Acha, C. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. application/pdf http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar J Appl Phys 2013;114(24) Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses Cyclic electric field stress on bipolar resistive switching devices info:eu-repo/semantics/article info:ar-repo/semantics/artículo info:eu-repo/semantics/publishedVersion http://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=artiaex&d=paper_00218979_v114_n24_p_Schulman_oai |
| institution |
Universidad de Buenos Aires |
| institution_str |
I-28 |
| repository_str |
R-145 |
| collection |
Repositorio Digital de la Universidad de Buenos Aires (UBA) |
| topic |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses |
| spellingShingle |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses Schulman, A. Acha, C. Cyclic electric field stress on bipolar resistive switching devices |
| topic_facet |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses |
| description |
We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied pulses N on the relative amplitude of the remnant resistance change between the high (RH) and the low (R L) state [( = (R H-R L) / R L] at different temperatures (T). We show that the critical voltage (Vc) needed to produce a resistive switching (RS, i.e., > 0) decreases with increasing N or T. We also find a power law relation between the voltage of the pulses and the number of pulses N 0 required to produce a RS of = 0. This relation remains very similar to the Basquin equation used to describe the stress-fatigue lifetime curves in mechanical tests. This points out to the similarity between the physics of the RS, associated with the diffusion of oxygen vacancies induced by electrical pulses, and the propagation of defects in materials subjected to repeated mechanical stress. © 2013 AIP Publishing LLC. |
| format |
Artículo Artículo publishedVersion |
| author |
Schulman, A. Acha, C. |
| author_facet |
Schulman, A. Acha, C. |
| author_sort |
Schulman, A. |
| title |
Cyclic electric field stress on bipolar resistive switching devices |
| title_short |
Cyclic electric field stress on bipolar resistive switching devices |
| title_full |
Cyclic electric field stress on bipolar resistive switching devices |
| title_fullStr |
Cyclic electric field stress on bipolar resistive switching devices |
| title_full_unstemmed |
Cyclic electric field stress on bipolar resistive switching devices |
| title_sort |
cyclic electric field stress on bipolar resistive switching devices |
| publishDate |
2013 |
| url |
http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman http://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=artiaex&d=paper_00218979_v114_n24_p_Schulman_oai |
| work_keys_str_mv |
AT schulmana cyclicelectricfieldstressonbipolarresistiveswitchingdevices AT achac cyclicelectricfieldstressonbipolarresistiveswitchingdevices |
| _version_ |
1766026550212296704 |