Multilocalization of interference fringes in the Mach-Zender interferometer

The phenomenon of multiple localization in a Mach-Zender interferometer illuminated by a system of incoherent equidistant linear sources is studied. The relation between multilocalization and diffraction at a grating of period equal to the spacing between the sources composing the illumination syste...

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Autor principal: Simon, J.M
Otros Autores: Echarri, Rodolfo Manuel, Walsh, P.A
Formato: Acta de conferencia Capítulo de libro
Lenguaje:Inglés
Publicado: Wissenschaftliche Verlagsgesellschaft 2000
Acceso en línea:Registro en Scopus
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100 1 |a Simon, J.M. 
245 1 0 |a Multilocalization of interference fringes in the Mach-Zender interferometer 
260 |b Wissenschaftliche Verlagsgesellschaft  |c 2000 
270 1 0 |m Simon, J.M.; Ciudad Universitaria, Buenos Aires, Argentina 
504 |a Simon, J.M., Simon, M.C., Echarri, R., Garea, M.T., Fringe localization in interferometers illuminated by a succession of incoherent line sources (1998) J. Mod. Opt., 45, pp. 2245-2254 
504 |a Simon, J.M., Iemmi, C.C., Method of adjusting an interferometer (1990) Appl. Opt., 29, pp. 3569-3570 
506 |2 openaire  |e Política editorial 
520 3 |a The phenomenon of multiple localization in a Mach-Zender interferometer illuminated by a system of incoherent equidistant linear sources is studied. The relation between multilocalization and diffraction at a grating of period equal to the spacing between the sources composing the illumination system is analyzed. Using the former relation an adjustment method is developed for interferometers of separated beams. This method enables the interference fringes at the different focalization planes to be seen without readjusting the alignment. This enables to observe perturbations at different planes with the simple focalization of the camera.  |l eng 
593 |a Laboratorio de Optica, Departamento de Física, Ciudad Universitaria, Pabellón I, (1428) Buenos Aires, Argentina 
690 1 0 |a CAMERAS 
690 1 0 |a DIFFRACTION GRATINGS 
690 1 0 |a LIGHT INTERFERENCE 
690 1 0 |a PERTURBATION TECHNIQUES 
690 1 0 |a INTERFERENCE FRINGES 
690 1 0 |a MACH-ZENDER INTERFEROMETERS 
690 1 0 |a INTERFEROMETERS 
700 1 |a Echarri, Rodolfo Manuel 
700 1 |a Walsh, P.A. 
711 2 |c Stuttgart, Germany 
773 0 |d Wissenschaftliche Verlagsgesellschaft, 2000  |g v. 111  |h pp. 307-309  |k n. 7  |p Optik (Jena)  |x 00304026  |w (AR-BaUEN)CENRE-2208  |t Optik (Jena) 
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