The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting

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The Mach-Zehnder interferometer can be used as is customary in optical testing but, to examine different layers of a volume, the procedure of either readjusting the interferometer or displacing the specimen can be avoided, employing an incoherent periodic source. In this case, leaving the specimen i...

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Detalles Bibliográficos
Autor principal: Simon, J.M
Otros Autores: Comastri, Silvia Ana Elva, Echarri, Rodolfo Manuel
Formato: Capítulo de libro
Lenguaje:Inglés
Publicado: 2001
Acceso en línea:Registro en Scopus
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Biblioteca Central Dr. Luis F. Leloir (FCEN) de Universidad de Buenos Aires
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100 1 |a Simon, J.M. 
245 1 4 |a The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting 
260 |c 2001 
270 1 0 |m Simon, J.M.; Universidad de Buenos Aires, Facultad Ciencias Exactas Naturales, Laboratorio de Optica, Pabellón I (1428) Nuñez, Buenos Aires, Argentina; email: simon@df.uba.ar 
504 |a Steel, W.H., (1967) Interferometry, , (London: Cambridge University Press) 
504 |a Malacara, D., (1978) Optical Shop Testing, , (New York: Wiley) 
504 |a Hariharan, P., Modified Mach-Zehnder interferometer (1969) Appl. Opt., 8, pp. 1925-1926 
504 |a Simon, J.M., Iemmi, C.C., Interferometers: Equivalent sine condition and pseudoholographic properties (1990) Appl. Opt., 29, pp. 1868-1869 
504 |a Schwider, J., Falkenstrfer, O., Twyman-Green interferometer for testing microspheres (1995) Opt. Eng., 34, pp. 2972-2975 
504 |a Simon, J.M., Comastri, S.A., Localization of interference fringes (1980) Am. J. Phys., 48, pp. 665-668 
504 |a Simon, J.M., Comastri, S.A., Fringe localization depth (1987) Appl. Opt., 26, pp. 5125-5129 
504 |a Simon, J.M., Comastri, S.A., Interferometers: Equivalent sine condition (1988) Appl. Opt., 27, pp. 4725-4730 
504 |a Simon, J.M., Simon, M.C., Echarri, R.M., Garea, M.T., Fringe localization in interferometers illuminated by a succession of incoherent line sources (1998) J. Mod. Opt., 45, pp. 2245-2254 
504 |a Comastri, S.A., Simon, J.M., Tardin, C., Multilocalization and van Cittert-Zernike theorem 1. Theory (2000) J. Opt. Soc. Am. A, 17, pp. 1265-1276 
504 |a Simon, J.M., Comastri, S.A., Tardin, C., Multilocalization and van Cittert-Zernike theorem 2. Application to the Wollaston prism (2000) J. Opt. Soc. Am. A, 17, pp. 1277-1283 
504 |a Jahns, J., Lohmann, A.W., The Lau effect (a diffraction experiment with incoherent illumination) (1979) Opt. Commun., 28, pp. 263-267 
504 |a Simon, J.M., Comastri, S.A., Echarri, R.M., Shifting of localization planes in optical testing: Application to a shearing interferometer Cuaderno de Optica, 77. , E Ediciones Previas, Lab. de Optica, FCEN-UBA, available from the authors at the address on the title page 
504 |a Simon, J.M., Echarri, R.M., Walsh, P.A., Multilocalization of interference fringes in the Mach-Zehnder interferometer (2000) Optik, 111, pp. 307-309 
504 |a Malacara, D., Serven, M., Malacara, Z., (1998) Interferogram Analysis for Optical Testing, , (New York: Dekker) 
504 |a Dorredo, B.V., Fernandez, J.L., Phase-evaluation methods in whole-field optical measurements techniques (1999) Meas. Sci. Technol., 10, pp. 33-55 
506 |2 openaire  |e Política editorial 
520 3 |a The Mach-Zehnder interferometer can be used as is customary in optical testing but, to examine different layers of a volume, the procedure of either readjusting the interferometer or displacing the specimen can be avoided, employing an incoherent periodic source. In this case, leaving the specimen in a fixed position and without readjusting the interferometer, the different layers can be analysed, shifting a non-classical localization plane by a change in the source period. In this paper experimental interferograms, obtained by varying this period to map the disturbances present on either one or both faces of a phase object, are shown.  |l eng 
593 |a Universidad de Buenos Aires, Departamento de Fisica, Ciudad Universitaria, Buenos Aires, Argentina 
593 |a Consejo Nacional de Investigaciones Cientificas y Técnicas, Argentina 
690 1 0 |a INTERFEROMETRY 
690 1 0 |a TRANSPARENT MEDIA EXPLORATION 
690 1 0 |a INCOHERENT PERIODIC SOURCE 
690 1 0 |a LOCALIZATION PLANE SHIFTING 
690 1 0 |a MACH-ZEHNDER INTERFEROMETER 
690 1 0 |a TRANSPARENT MEDIA EXPLORATION 
690 1 0 |a HOLOGRAPHIC INTERFEROMETRY 
690 1 0 |a LIGHT POLARIZATION 
690 1 0 |a LIGHT REFLECTION 
690 1 0 |a MIRRORS 
690 1 0 |a OPTICAL BEAM SPLITTERS 
690 1 0 |a OPTICAL TESTING 
690 1 0 |a REFRACTION 
690 1 0 |a VOLUME MEASUREMENT 
690 1 0 |a INTERFEROMETERS 
700 1 |a Comastri, Silvia Ana Elva 
700 1 |a Echarri, Rodolfo Manuel 
773 0 |d 2001  |g v. 3  |h pp. 242-249  |k n. 4  |p J Opt A Pure Appl Opt  |x 14644258  |w (AR-BaUEN)CENRE-5726  |t Journal of Optics A: Pure and Applied Optics 
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856 4 0 |u https://doi.org/10.1088/1464-4258/3/4/303  |x doi  |y DOI 
856 4 0 |u https://hdl.handle.net/20.500.12110/paper_14644258_v3_n4_p242_Simon  |x handle  |y Handle 
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