Silicon device processing ; proceedings /

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Detalles Bibliográficos
Autores Corporativos: Symposium on Silicon Device Processing Gaithersburg, Md., American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics
Otros Autores: Marsden, Charles P. (ed.)
Formato: Documento Gubernamental Acta de conferencia Libro
Lenguaje:Inglés
Publicado: Washington : U.S. National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1970.
Colección:NBS special publication ; 337
Materias:
Aporte de:Registro referencial: Solicitar el recurso aquí
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260 # # |a Washington :  |b U.S. National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off.,  |c 1970. 
300 # # |a x, 457 p. :  |b il. ;  |c 27 cm. 
490 1 # |a NBS special publication ;  |v 337 
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