Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
Dosimetry
4
MOS devices
4
Radiation effects
4
Absorbed dose
2
Analytic expressions
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Dose measurements
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Dose range
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Dosimeters
2
Error compensation
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Experimental data
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Gamma rays
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Induced charges
2
Initial saturation
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Interface trapping
2
Interface traps
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Ionizing radiation
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Irradiation
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Measurement range
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Measurement techniques
2
Metal oxide semiconductor
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Metallic compounds
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Positive oxide charge
2
Radiation shielding
2
Semiconductor devices
2
Temperature
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Temperature fluctuation
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Thick gate oxides
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Wear effects
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Zero temperature coefficients
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ionizing radiation sensors
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1Publicado 2011Materias: “...Interface traps...”
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2por Carbonetto, S.H., García Inza, M.A., Lipovetzky, J., Redin, E.G., Sambuco Salomone, L., Faigon, A.Materias: “...Interface traps...”
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3Publicado 2008Materias: “...Interface trapping...”
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4Materias: “...Interface trapping...”
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