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MOS devices
7
High-k gate dielectrics
6
High-K gate dielectrics
5
Capacitance
4
Comparative analysis
4
Hafnium oxides
4
High-k dielectric
4
Radiation effects
4
Alumina
2
C-V curve
2
Capacitance voltage
2
Capacitance-voltage curve
2
Capacitive structure
2
Charge trapping/detrapping
2
Dielectric materials
2
Gamma photons
2
Gate dielectrics
2
Hysteresis
2
Insulating layers
2
Nanoelectronics
2
Nanolaminate
2
Normal operating conditions
2
Oxygen ions
2
Physical parameters
2
Radiation Effects
2
hysteresis
2
radiation effects
2
Electron traps
1
Ingeniería
1
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1por Sambuco Salomone, Lucas, Carbonetto, Sebastián, García Inza, Mariano, Lipovetzky, José, Redín, Eduardo Gabriel, Campabadal, Francesca, Faigón, AdriánMaterias: “...High-K gate dielectrics...”
Publicado 2011
Aportado por: SEDICI (UNLP)Objeto de conferencia -
2Publicado 2011Materias: “...High-K gate dielectrics...”
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3por Quinteros, C., Sambuco Salomone, L., Redín, E., Rafí, J.M., Zabala, M., Faigón, A., Palumbo, F., Campabadal, F.Materias: “...High-K gate dielectrics...”
CONF -
4Publicado 2012Materias: “...High-k gate dielectrics...”
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5por Quinteros, C.P., Salomone, L.S., Redin, E., Rafí, J.M., Zabala, M., Faigón, A., Palumbo, F., Campabadal, F.Materias: “...High-k gate dielectrics...”
JOUR -
6Publicado 2011Materias: “...High-K gate dielectrics...”
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7por Salomone, L.S., Carbonetto, S.H., Inza, M.A.G., Lipovetzky, J., Redín, E.G., Campabadal, F., Faigón, A.Materias: “...High-K gate dielectrics...”
CONF