Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
Insulating layers
Aluminum
2
Atomic layer deposited
2
Atomic layer deposition
2
C-V measurement
2
Capacitance
2
Capacitance-voltage curve
2
Capacitance-voltage techniques
2
Charge trapping/detrapping
2
Constant capacitance
2
Critical temperatures
2
Crystal lattices
2
Electrical characteristic
2
Electron trap density
2
Electron traps
2
Experimental evidence
2
Gate dielectrics
2
Hafnium oxides
2
High-K gate dielectrics
2
High-k gate dielectrics
2
Hysteresis
2
Insulating materials
2
Insulation
2
Low temperature effects
2
MOS capacitors
2
MOS devices
2
Main effect
2
Matching fields
2
Nanoelectronics
2
Non-volatile memories
2
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5por Carreira, S.J., Bekeris, V., Rosen, Y.J., Monton, C., Schuller, I.K., Calzetta E., Centro Latinoamericano de Fisica (CLAF); Consejo Nacional de Investigaciones Cientificas y Tecnicas (CONICET); International Centre for Theoretical Physics (ICTP) and Universidad de Buenos Aires (UBA); International Union of Pure and Applied Physics (IUPAP); Ministerio de Ciencia, Tecnologia e Innovacion Productiva (MINCYT)CONF
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