Measuring uncertainty through word vector representations

por Aromí, J. Daniel
Publicado 2017

Estimation of the extrapolation error in the calibration of type S thermocouples

por Giorgio, P., Garrity, K.M., Jiménez Rebagliati, M., García Skabar, J., INTI-Física y Metrología. Buenos Aires, AR, National Institute of Standards and Technology. NIST. Gaithersburg, US
Publicado 2013

Multivariate statistics applied to assess measurement uncertainty of complex reflection coefficient

por Benjamín, M., Silva, H., Monasterios, G., Tempone, N., Henze, A., INTI-Electrónica e Informática. Laboratorio Metrología RF & Microondas. Buenos Aires, AR, Conference on Precision Electromagnetic Measurements CPEM 2014 (pp. 18-19)
Publicado 2014

High resistance measurements with a two-terminal cryogenic current comparator

por Bierzychudek, M., Tonina, A., INTI-Física y Metrología. Buenos Aires, AR, Conference on precision electromagnetic measurements
Publicado 2012

Key comparison CCQM-K59 : determination of nitrite and nitrate in calibration solutions. Final report

por Máriássy, Michal, Hioki, Akiharu, Konopelko, Leonid A., Dimchoglo, Irina, Winchester, Michael, Butler, Therese, Case, Ryan, Hernández, Ana, Galli, Ariel, Alvarez, Pablo, Lee, Joung Hae, Royer, Chantal, Shi, Naijie, Chao, Jingbo, Wu, Bing, Li, Haifeng, Turk, Gregory
Publicado 2008

Comparison of the Josephson voltage standards of the INTI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.a)

por Solve, S., Chayramy, R., Stock, M., Iuzzolino, R., Tonina, A., Bureau International des Poids et Mesures. BIPM. Sèvres, FR, INTI-Física y Metrología. Buenos Aires, AR
Publicado 2012

Force standards comparison at 1 kN and 50 kN among national laboratories from EUROMET and SIM

por Villarroel-Poblete, C., Torres-Guzman, , J. C., Averlant, P., Knott, A., Kumme, R., Robles-Carbonell, J. A., Ramirez-Ahedo, D., Giobergia, L. R., International Conference IMEKO TC3, 20, International Conference IMEKO TC16, 3, International Conference IMEKO TC22, 1
Publicado 2007

Key comparison CCQM-K73 amount content of H+ in hydrochloric acid (0.1 mol·kg-1)

por Pratt, Kenneth W., Ortiz-Aparicio, Jose Luis, Matehuala-Sanchez, Francisco Javier, Pawlina, Monika, Kozłowski, Władysław, Borges, Paulo P., da Silva Junior, Wiler B., Borinsky, Mónica B., Hernandez, Ana, Puelles, Mabel, Hatamleh, Nadia, Acosta, Osvaldo, Nunes, João, Guiomar Lito, M. J., Camões, M. Filomena, Filipe, Eduarda, Hwang, Euijin, Lim, Youngran, Bing, Wu, Qian, Wang, Chao, Wei, Hioki, Akiharu, Asakai, Toshiaki, Máriássy, Michal, Hanková, Zuzana, Nagibin, Sergey, Manska, Olexandra, Gavrilkin, Vladimir, Kutovoy, Viatcheslav
Publicado 2013

Final report; Capacitance Comparison

por Cazabat, M., Ogino, L. M., Kyriazis, G., Vasconcellos, R. T. B., Wood, B., Kochav, K., Sánchez, H., Castro, B. I., Moreno, J. A., Koffman, A., Zhang, N. F., Wang, Y., Shields, S., Slomovitz, D., Izquierdo, D., Faverio, C., INTI-Física y Metrología. Buenos Aires, AR, INMETRO. Rio de Janeiro, BR, NRC. Ottawa, CA, ICE. San José, CR, CENAM. Querétaro, MX, NIST. Gaithersburg, US, UTE. Montevideo, UY
Publicado 2012

Application of the grid convergence index to a laminar axisymmetric sudden expansion flow

por Carrillo, Verónica M., Petrie, John E., Pacheco, Esteban, Universidad de Cuenca, Dirección de Investigación de la Universidad de Cuenca, DIUC
Publicado 2015

Uncertainty evaluation in two-terminal cryogenic current comparator

por Bierzychudek, Marcos E., Elmquist, Randolf E., Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR, National Institute of Standards and Technology. Gaithersburg, US, Conference on Precision Electromagnetic Measurements. CPEM
Publicado 2008

Computation and Uncertainty Evaluation of Offset Yield Strength

por Matusevich, Ariel, Mancini, Reinaldo, Massa, Julio, INTI-Córdoba. Laboratorio de Materiales. Córdoba, AR
Publicado 2013

Force standards comparison at 100 KN among national laboratories from Inter American Metrology System SIM

por Villarroel Poblete, Juan Christian, Oliva C., Hernán, Soto Pinto, Luis Rubén, Cárdenas, Alejandro, Torres Guzmán, Jorge C., Dajes, Arístides, Savarín, Alejandro, IMEKO World Congress “Measurement in Research and Industry”, 21
Publicado 2015

CCQM-K55.b (Aldrin) : Final report: october 2012. CCQM-K55.b key comparison on the characterization of organic substances for chemical purity

por Westwood, Steven, Josephs, Ralf, Choteau, Tiphaine, Daireaux, Adeline, Mesquida, Charline, Wielgosz, Robert, Rosso, Adriana, Ruiz de Arechavaleta, Mariana, Davies, Stephen, Wang, Hongjie, Cristina Pires do Rego, Eliane, Marques Rodrigues, Janaína, de Freitas Guimarães, Evelyn, Barreto Sousa, Marcus Vinicius, Monteiro, Tânia Maria, Alves das Neves Valente, Laura, Marques Violante, Fernando Gustavo, Rubim, Renato, Almeida, Ribeiro, Baptista Quaresma, Maria Cristina, Nogueira, Raquel, Windust, Anthony, Dai, Xinhua, Li, Xiaomin, Zhang, Wei, Li, Ming, Shao, Mingwu, Wei, Chao, Wong, Siu-kay, Cabillic, Julie, Gantois, Fanny, Philipp, Rosemarie, Pfeifer, Dietmar, Hein, Sebastian, Klyk-Seitz, Urszula-Anna, Ishikawa, Keiichiro, Castro, Esther, Gonzalez, Norma, Krylov, Anatoly, Lin, Teo Tang, Kooi, Lee Tong, Fernandes-Whaley, M., Prévoo, D., Archer, M., Visser, R., Nlhapo, N., de Vos, B., Ahn, Seonghee, Pookrod, Preeyaporn, Wiangnon, Kanjana, Sudsiri, Nittaya, Muaksang, Kittiya, Cherdchu, Chainarong, Gören, Ahmet Ceyhan, Bilsel, Mine, LeGoff, Thierry, Bearden, Dan, Bedner, Mary, Duewer, David, Hancock, Diane, Lang, Brian, Lippa, Katrice, Schantz, Michele, Sieber, John
Publicado 2012

Uncertainty evaluation in two-terminal cryogenic current comparator

por Bierzychudek, Marcos E., Elmquist, Randolf E., Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR, National Institute of Standards and Technology. NIST. Gaithersburg, US
Publicado 2009

Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper

por Hioki, Akiharu, Nonose, Naoko, Liandi, Ma, Jingbo, Chao, Liuxing, Feng, Chao, Wei, Cho, Kyung Haeng, Suh, Jung Ki, Min, Hyung Sik, Lim, Youngran, Recknagel, Sebastian, Koenig, Maren, Vogl, Jochen, Caciano de Sena, Rodrigo, dos Reis, Lindomar Augusto, Borinsky, Mónica, Puelles, Mabel, Hatamleh, Nadia, Acosta, Osvaldo, Turk, Gregory, Rabb, Savelas, Sturgeon, Ralph, Methven, Brad, Rienitz, Olaf, Jaehrling, Reinhard, Konopelko, L. A., Kustikov, Yu. A., Kozyreva, S. B., Korzh, A. A.
Publicado 2013

Strategies for building an AC-DC transfer scale

por Laiz, Héctor, Kornblit, Fernando, Di Lillo, Lucas, Instituto Nacional de Tecnología Industrial. INTI. Buenos Aires, AR, Simposio de Metrología
Publicado 2006

Technical protocol: key comparison SIM.EM.RF-K5b.CL; scattering coefficients by broad-band methods 2 GHz - 18 GHz - Type N connector

por Silva, H., Monasterios, G., INTI-Electrónica e Informática. Buenos Aires, AR
Publicado 2012

SIM comparison of AC-DC current transfer difference, SIM.EM-K12

por Di Lillo, Lucas, Yasuda, Eliana, Lipe, Thomas, Campos, Sara, Spaggiari, Alfredo, Slomovitz, Daniel, Faverio, Carlos, Filipski, Piotr, Vasconcellos, Renata, Geronymo, Gean, Afonso, Renato, Halawa, Mamdouh, INTI-Física y Metrología. Buenos Aires, AR, National Institute of Standards and Technology. NIST. Gaithersburg, US, Centro Nacional de Metrología. CENAM. Querétaro, MX, Administración Nacional de Usinas y Transmisiones Eléctricas. UTE. Montevideo, UY, National Research Council. NRC. Washington, US, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial. INMETRO. Rio de Janeiro, BR, National Institute for Standards. NIS. Gizah, EG, Conference on Precision Electromagnetic Measurements CPEM 2014 (pp. 268-269)
Publicado 2014

The SIM time network

por Lombardi, Michael A., Novick, Andrew N., López R., J. Mauricio, Jiménez, Francisco, López, Eduardo, Boulanger, Jean-Simon, Pelletier, Raymond, Carvalho, Ricardo J. de, Solís, Raúl, Sánchez, Harold, Quevedo, Carlos Andrés, Pascoe, Gregory, Pérez, Daniel, Bances, Eduardo, Trigo, Leonardo, Masi, Víctor, Postigo, Henry, Questelles, Anthony, Gittens, Anselm, National Institute of Standards and Technology. NIST. Boulder, CO, US, Centro Nacional de Metrología. CENAM. Querétaro, MX, National Research Council. NRC. Ottawa, CA, National Observatory. ONRJ. Río de Janeiro, BR, Centro Nacional de Metrología de Panamá. CENAMEP. Panama City, PA, Instituto Costarricense de Electricidad. ICE. San José, CR, Superintendencia de Industria y Comercio. SIC. Bogotá, CO, Bureau of Standards Jamaica. BSJ. Kingston, JM, Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR, Laboratorio Nacional de Metrología. LNM. Guatemala City, GT, Administracion Nacional de Usinas y Trasmisiones Eléctricas . UTE. Montevideo, UY, Instituto Nacional de Tecnología Normalización y Metrología. INTN. Asunción, PY, Servicio Nacional de Metrología. SNM, INDECOPI. Lima, PE, Trinidad and Tobago Bureau of Standards. TTBS, TT, Saint Lucia Bureau of Standard. SLBS. Castries, LC
Publicado 2011