Materias dentro de su búsqueda.
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Capacitance
2
Hafnium oxides
2
High-k dielectric
2
High-k gate dielectrics
2
MOS devices
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Nanoelectronics
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Radiation effects
2
Alumina
1
Capacitance voltage
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Capacitance-voltage curve
1
Charge trapping/detrapping
1
Comparative analysis
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Gamma photons
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Gate dielectrics
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Hafnium compounds
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High-K dielectrics
1
High-K gate dielectrics
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Hysteresis
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Insulating layers
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MOS
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MOS capacitors
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Measurement techniques
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Nanolaminate
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Normal operating conditions
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Oxygen ions
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hysteresis
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1por Salomone, L.S., Kasulin, A., Inza, M.G., Lipovetzky, J., Redin, E., Carbonetto, S., Campabadal, F., Faigón, A.Materias: “...Hafnium compounds...”
CONF -
2por Quinteros, C.P., Salomone, L.S., Redin, E., Rafí, J.M., Zabala, M., Faigón, A., Palumbo, F., Campabadal, F.Materias: “...Hafnium oxides...”
JOUR -
3por Salomone, L.S., Carbonetto, S.H., Inza, M.A.G., Lipovetzky, J., Redín, E.G., Campabadal, F., Faigón, A.Materias: “...Hafnium oxides...”
CONF