Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
High-k gate dielectrics
3
MOS devices
3
Capacitance
2
Comparative analysis
2
Hafnium oxides
2
High-K gate dielectrics
2
High-k dielectric
2
Insulating layers
2
Radiation effects
2
Alumina
1
Aluminum
1
Atomic layer deposited
1
Atomic layer deposition
1
C-V curve
1
C-V measurement
1
Capacitance voltage
1
Capacitance-voltage curve
1
Capacitance-voltage techniques
1
Capacitive structure
1
Charge trapping/detrapping
1
Constant capacitance
1
Dielectric materials
1
Electrical characteristic
1
Electron trap density
1
Electron traps
1
Experimental evidence
1
Gamma photons
1
Gate dielectrics
1
Hysteresis
1
MOS capacitors
1
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1por Quinteros, C.P., Salomone, L.S., Redin, E., Rafí, J.M., Zabala, M., Faigón, A., Palumbo, F., Campabadal, F.Materias: “...Capacitance voltage...”
JOUR -
2por Salomone, L.S., Carbonetto, S.H., Inza, M.A.G., Lipovetzky, J., Redín, E.G., Campabadal, F., Faigón, A.Materias: “...Capacitance-voltage curve...”
CONF -
3por Sambuco Salomone, L., Lipovetzky, J., Carbonetto, S.H., García Inza, M.A., Redin, E.G., Campabadal, F., Faigón, A.Materias: “...Capacitance-voltage techniques...”
JOUR -
4por Quinteros, C., Sambuco Salomone, L., Redín, E., Rafí, J.M., Zabala, M., Faigón, A., Palumbo, F., Campabadal, F.Materias: “...Capacitive structure...”
CONF