Autor
Jones, George R.
Davydov, Albert V.
2
Di Lillo, Lucas
2
Elmquist, Randolph E.
2
INTI-Física y Metrología. Buenos Aires, AR
2
Landim, Regis
2
Lipe, Thomas
2
Real, Mariano
2
Shen, Tian
2
Soons, Johannes A.
2
Conference on precision electromagnetic measurements
1
Institute of Electrical and Electronics Engineers. IEEE. New York, US
1
Lass, Eric A.
1
Liu, Fan-Hung
1
National Institute of Standards and Technology. NIST. Gaithersburg, US
1
Newell, David B.
1