Autor
American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics
1
Basu, P. K. (Prasanta Kumar)
1
Casella, Federico
1
Chrostowski, Lukas
1
Cintas, Ana
1
Deen, M. Jamal
1
Ferrón, Julio
1
Hochberg, Michael E.
1
La Forgia, Nicolás
1
Lipovetzky, José
1
Marsden, Charles P.
1
Passeggi, Mario C. G.
1
Pastoriza, Hernán
1
Runyan, W. R.
1
Sanz, Darío
1
Shalóm, Diego Edgar, director
1
Symposium on Silicon Device Processing Gaithersburg, Md
1
Vidal, Ricardo A.
1
Vivien, Laurent
1
Weir, Alexis
1
Wolf, Helmut F.
1
Zamorano Labbé, Felipe E.
1
Zampieri, Guillermo
1