Autor
Acosta, Osvaldo
3
Asakai, Toshiaki
3
Bing, Wu
3
Borges, Paulo P.
3
Borinsky, Mónica B.
3
Camões, M. Filomena
3
Chao, Wei
3
Filipe, Eduarda
3
Gavrilkin, Vladimir
3
Guiomar Lito, M. J.
3
Hanková, Zuzana
3
Hatamleh, Nadia
3
Hernandez, Ana
3
Hioki, Akiharu
3
Hwang, Euijin
3
Lim, Youngran
3
Manska, Olexandra
3
Matehuala-Sanchez, Francisco Javier
3
Máriássy, Michal
3
Nagibin, Sergey
Nunes, João
3
Ortiz-Aparicio, Jose Luis
3
Pawlina, Monika
3
Pratt, Kenneth W.
3
Puelles, Mabel
3
Qian, Wang
3
Kozłowski, Władysław
2
Kutovoy, Viatcheslav
2
da Silva Junior, Wiler B.
2
All-Russian Scientific Institute for Physical-Technical and Radiological Measurements. VNIIFTRI, RU
1
Centro Nacional de Metrología. CENAM, MX
1
Dansk Fundamental Metrology. DFM, DK
1
Główny Urząd Miar. GUM, PL
1
INTI-Química. Buenos Aires, AR
1
Instituto Nacional de Metrologia, Normalização e Qualidade Industrial. INMETRO, BR
1
Instituto Português da Qualidade - Scientific and Applied Metrology Unit. IPQ/UMCA-LCM, PT
1
Korea Research Institute of Standards and Science. KRISS, KR
1
Kozłowski, Władysław
1
National Institute of Metrology of P. R. China. NIM, CN
1
National Institute of Standards and Technology. NIST, US
1
National Metrology Institute of Japan. NMIJ, JP
1
Silva, Wiler B. da
1
Slovenský Metrologický Ústav. SMU, SK
1
Ukrainian State Research and Production Center of Standardization Metrology, Certification, and Consumers’ Rights Protection. UMTS, UA
1