Autor
Elmquist, Randolph E.
4
Liu, Fan-Hung
Newell, David B.
3
Barbara, Paola
2
Fukuyama, Yasuhiro
2
Huang, Lung-I
2
INTI-Física y Metrología. Buenos Aires, AR
2
Lass, Eric A.
2
Liang, Chi-Te
2
Real, Mariano
2
Real, Mariano A.
2
Soons, Johannes A.
2
Yang, Yanfei
2
Davydov, Albert V.
1
Institute of Electrical and Electronics Engineers. IEEE. New York, US
1
Jones, George R.
1
National Institute of Standards and Technology. NIST. Gaithersburg. New York, US
1
Shen, Tian
1
TecnoINTI 2013
1
Tonina, A.
1