Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces

The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil pro...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Barber, M.E., Grings, F.M., álvarez-Mozos, J., Piscitelli, M., Perna, P.A., Karszenbaum, H.
Formato: JOUR
Materias:
Correlation length
Height standard deviation
Laser profiler
Radar applications
Scattering models
Surface soil roughness
Agriculture
Backscattering
Parameter estimation
Soils
Surface roughness
Correlation lengths
Laser profilers
Scattering model
Standard deviation
Surface soil
Soil surveys
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_20724292_v8_n6_p_Barber
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

Ejemplares similares

Ejemplares similares