Characterization of porous thin films using quartz crystal shear resonators

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A new model for the characterization of porous materials using quartz crystal impedance analysis is proposed. The model describes the equivalent electrical and/or mechanical impedance of the quartz crystal in contact with a finite layer of a rigid porous material which is immersed in a semi-infinite...

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Detalles Bibliográficos
Autores principales:	Etchenique, R., Brudny, V.L.
Formato:	JOUR
Materias:	Electric properties Film growth Mathematical models Mechanical properties Numerical methods Porosity Porous materials Viscosity Kanazawa equation Quartz crystal shear resonators Sauerbrey equation Thin films
Acceso en línea:	http://hdl.handle.net/20.500.12110/paper_07437463_v16_n11_p5064_Etchenique
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

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