Nonlinear optical nanoscope with depth resolution

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Existing optical scanning microscopes don't allow the determination of the depth below the surface of the sample under which where scatterers might be located, due to the simple exponential decay of their evanescent probing field. We propose a nonlinear near field microscope which would allow t...

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Detalles Bibliográficos
Autores principales: Mochán, W.L., López-Bastidas, C., Maytorena, J.A., Mendoza, B.S., Brudny, V.L.
Formato: CONF
Materias:
Nanoscope
Near field optical microscope
Surface optical second harmonic generation
Imaging techniques
Light propagation
Near field scanning optical microscopy
Optical fibers
Optical resolving power
Optical waveguides
Scanning tunneling microscopy
Second harmonic generation
Sensitivity analysis
Thin films
Three dimensional computer graphics
Nonlinear optical nanoscopes
Scanning near-field optical microscopes (SNOM)
Second harmonic (SH)
Surface optical second harmonic generations
Nonlinear optics
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_0277786X_v5622_nPART1_p524_Mochan
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

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