Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diff...
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| Autores principales: | , , |
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| Formato: | CONF |
| Materias: | |
| Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_02729172_v1526_n_p47_Domene |
| Aporte de: |
| Sumario: | In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diffusivity at microscopic levels, hence mapping such magnitude over a sample surface. The induced thermal expansion defocuses the probe beam due to the surface deformation (curvature). The dependence of the defocusing with the pump modulation frequency yields the thermal diffusivity of the sample at the impinging location. The explored depth is controlled by the pump beam size. By scanning both beams, a complete map of the thermal diffusivity can be retrieved. © 2013 Materials Research Society. |
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