Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)

An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defoc...

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Autores principales: Domené, E.A., Martínez, O.E.
Formato: JOUR
Materias:
Axial resolutions
Defocusing
Detection device
Detection methods
Detection scheme
Four-quadrant
Lateral resolution
Nonlinear curve fitting
Probe laser
Pump beams
Surface curvatures
Thermoreflectance
Curve fitting
Cutoff frequency
Thermal expansion
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00346748_v84_n1_p_Domene
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id todo:paper_00346748_v84_n1_p_Domene
record_format dspace
spelling todo:paper_00346748_v84_n1_p_Domene2023-10-03T14:46:09Z Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM) Domené, E.A. Martínez, O.E. Axial resolutions Defocusing Detection device Detection methods Detection scheme Four-quadrant Lateral resolution Nonlinear curve fitting Probe laser Pump beams Surface curvatures Thermoreflectance Curve fitting Cutoff frequency Thermal expansion An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm). © 2013 American Institute of Physics. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00346748_v84_n1_p_Domene
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Axial resolutions
Defocusing
Detection device
Detection methods
Detection scheme
Four-quadrant
Lateral resolution
Nonlinear curve fitting
Probe laser
Pump beams
Surface curvatures
Thermoreflectance
Curve fitting
Cutoff frequency
Thermal expansion
spellingShingle Axial resolutions
Defocusing
Detection device
Detection methods
Detection scheme
Four-quadrant
Lateral resolution
Nonlinear curve fitting
Probe laser
Pump beams
Surface curvatures
Thermoreflectance
Curve fitting
Cutoff frequency
Thermal expansion
Domené, E.A.
Martínez, O.E.
Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
topic_facet Axial resolutions
Defocusing
Detection device
Detection methods
Detection scheme
Four-quadrant
Lateral resolution
Nonlinear curve fitting
Probe laser
Pump beams
Surface curvatures
Thermoreflectance
Curve fitting
Cutoff frequency
Thermal expansion
description An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm). © 2013 American Institute of Physics.
format JOUR
author Domené, E.A.
Martínez, O.E.
author_facet Domené, E.A.
Martínez, O.E.
author_sort Domené, E.A.
title Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_short Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_full Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_fullStr Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_full_unstemmed Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
title_sort note: focus error detection device for thermal expansion-recovery microscopy (therm)
url http://hdl.handle.net/20.500.12110/paper_00346748_v84_n1_p_Domene
work_keys_str_mv AT domeneea notefocuserrordetectiondeviceforthermalexpansionrecoverymicroscopytherm
AT martinezoe notefocuserrordetectiondeviceforthermalexpansionrecoverymicroscopytherm
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