High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator
Guardado en:
| Autores principales: | Bierzychudek, Marcos E., Elmquist, Randolf E., Jones, G. R., Pritchard, B., Hernández, F., Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR, National Measurement Institute. West Lindfield, AU, Centro Nacional de Metrología. Querétaro, MX, Conference on Precision Electromagnetic Measurements. CPEM |
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| Formato: | other |
| Lenguaje: | Inglés |
| Publicado: |
IEEE
2008
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| Materias: | |
| Acceso en línea: | http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASHf63a/b2085e25.dir/doc.pdf |
| Aporte de: |
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