Bierzychudek, M. E., Elmquist, R. E., Jones, G. R., Pritchard, B., Hernández, F., Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, A., . . . CPEM, C. o. P. E. M. (2008). High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator. IEEE.
Cita Chicago Style (17a ed.)Bierzychudek, Marcos E., Randolf E. Elmquist, G. R. Jones, B. Pritchard, F. Hernández, AR Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AU National Measurement Institute. West Lindfield, MX Centro Nacional de Metrología. Querétaro, y Conference on Precision Electromagnetic Measurements CPEM. High Resistance Scaling from 10 K[omega] and QHR Standards Using a Cryogenic Current Comparator. IEEE, 2008.
Cita MLA (8a ed.)Bierzychudek, Marcos E., et al. High Resistance Scaling from 10 K[omega] and QHR Standards Using a Cryogenic Current Comparator. IEEE, 2008.