Bierzychudek, M. E., Hernadez-Marquez, F. L., Jones, G. R. J., Elmquist, R. E., Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, A., Centro Nacional de Metrología. Querétaro, M., & National Institute of Standards and Technology. NIST. Gaithersburg, U. (2014). Precision high-value resistance scaling with a two-terminal cryogenic current comparator. s.n.
Cita Chicago Style (17a ed.)Bierzychudek, Marcos E., F. L. Hernadez-Marquez, G. R. Jr Jones, Randolf E. Elmquist, AR Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, MX Centro Nacional de Metrología. Querétaro, y US National Institute of Standards and Technology. NIST. Gaithersburg. Precision High-value Resistance Scaling with a Two-terminal Cryogenic Current Comparator. s.n, 2014.
Cita MLA (8a ed.)Bierzychudek, Marcos E., et al. Precision High-value Resistance Scaling with a Two-terminal Cryogenic Current Comparator. s.n, 2014.