Towards a metrology class ADC based on Josephson junction devices
Guardado en:
| Autores principales: | Belcher, Allan, Williams, Jonathan, Ireland, Jane, Iuzzolino, Ricardo, Bierzychudek, Marcos E., Dekker, Ronald, Herick, Jonas, Behr, Ralf, Schaapman, Kars, World Congress of the International Measurement Confederation (IMEKO), 12 |
|---|---|
| Formato: | conferenceObject |
| Lenguaje: | Inglés |
| Publicado: |
IOP
2018
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| Materias: | |
| Acceso en línea: | http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASH7ccc.dir/doc.pdf |
| Aporte de: |
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