Digit span WAIS III: test-retest reliability analysis in argentine adults
Digit span WAIS III is a test frequently used in neuropsychological assessment to explore attentional span and working memory. Although the scientific literature assigns it good to excellent test-retest reliability, these studies have focused on the r coefficient, and not on the intraclass correlati...
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| Autores principales: | , , , , |
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| Formato: | Artículo revista |
| Lenguaje: | Español |
| Publicado: |
Instituto de Investigaciones Psicológicas
2025
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| Materias: | |
| Acceso en línea: | https://revistas.unc.edu.ar/index.php/racc/article/view/40827 |
| Aporte de: |
| Sumario: | Digit span WAIS III is a test frequently used in neuropsychological assessment to explore attentional span and working memory. Although the scientific literature assigns it good to excellent test-retest reliability, these studies have focused on the r coefficient, and not on the intraclass correlation coefficient or ICC. In fact, the objective was to analyze the test-retest reliability for Digit span WAIS III using the ICC. Digit span WAIS III was administered to 85 argentines (average=64.1 years) at two different times with an average test-retest interval of 75.5 days. Digits back and Digits total obtained good reliability with ICC .61. Digits forward presented fair reliability with ICC .57. These results suggest that the temporal stability of the test is acceptable, but with values at the limit. Further reliability studies with ICC and shorter test-retest intervals would be desirable to ratify or rectify these new findings. |
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