Cita APA (7a ed.)

(1987). Highly-Accelerated hunidity Testing of CMOS ICs (Philips Electronic Components and Materials.). Philips Export B. V..

Cita Chicago Style (17a ed.)

Highly-Accelerated Hunidity Testing of CMOS ICs. Philips Electronic Components and Materials. The Netherlands: Philips Export B. V., 1987.

Cita MLA (8a ed.)

Highly-Accelerated Hunidity Testing of CMOS ICs. Philips Electronic Components and Materials. Philips Export B. V., 1987.