Cita APA (7a ed.)

Liu, X., & Xu, Q. (2014). Trace-Based Post-Silicon Validation for VLSI Circuits. Springer International Publishing : Imprint: Springer.

Cita Chicago Style (17a ed.)

Liu, Xiao, y Qiang Xu. Trace-Based Post-Silicon Validation for VLSI Circuits. Heidelberg: Springer International Publishing : Imprint: Springer, 2014.

Cita MLA (8a ed.)

Liu, Xiao, y Qiang Xu. Trace-Based Post-Silicon Validation for VLSI Circuits. Springer International Publishing : Imprint: Springer, 2014.