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    por Pratt, Kenneth W., Ortiz-Aparicio, Jose Luis, Matehuala-Sanchez, Francisco Javier, Pawlina, Monika, Kozłowski, Władysław, Borges, Paulo P., Silva, Wiler B. da, Borinsky, Mónica B., Hernandez, Ana, Puelles, Mabel, Hatamleh, Nadia, Acosta, Osvaldo, Nunes, João, Guiomar Lito, M. J., Camões, M. Filomena, Filipe, Eduarda, Hwang, Euijin, Lim, Youngran, Bing, Wu, Qian, Wang, Chao, Wei, Hioki, Akiharu, Asakai, Toshiaki, Máriássy, Michal, Hanková, Zuzana, Nagibin, Sergey, Manska, Olexandra, Gavrilkin, Vladimir, Centro Nacional de Metrología. CENAM, MX, Dansk Fundamental Metrology. DFM, DK, Główny Urząd Miar. GUM, PL, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial. INMETRO, BR, INTI-Química. Buenos Aires, AR, Instituto Português da Qualidade - Scientific and Applied Metrology Unit. IPQ/UMCA-LCM, PT, Korea Research Institute of Standards and Science. KRISS, KR, National Institute of Metrology of P. R. China. NIM, CN, National Institute of Standards and Technology. NIST, US, National Metrology Institute of Japan. NMIJ, JP, Slovenský Metrologický Ústav. SMU, SK, Ukrainian State Research and Production Center of Standardization Metrology, Certification, and Consumers’ Rights Protection. UMTS, UA, All-Russian Scientific Institute for Physical-Technical and Radiological Measurements. VNIIFTRI, RU
    Publicado 2012
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